Diffusion behaviour of Nb in yttria-stabilized zirconia single crystals: A SIMS, AFM and X-ray reflectometry investigations

Applied Surface Science

Volumn 253, Issue 3, 2006, Pages 1071-1080

  Kuri, G ^a   Gupta, M ^a   Schelldorfer, R ^a   Gavillet, D ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

AFM; Nb diffusion; SIMS; XRR; YSZ

Indexed keywords

ACTIVATION ENERGY; ATOMIC FORCE MICROSCOPY; DIFFUSION; SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; THERMOANALYSIS; ZIRCONIA;

DIFFUSION BEHAVIORS; NB DIFFUSION; YTTRIA-STABILIZED ZIRCONIA (YSZ);

NIOBIUM;

EID: 33750743074     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.173     Document Type: Article

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