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Volumn 2, Issue 26, 2014, Pages 5229-5234
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Fabrication of locally thinned down silicon nanowires
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPIC ETCHING;
ELECTRON BEAM LITHOGRAPHY;
FABRICATION;
NANOWIRES;
SILICON;
ALTERNATIVE ROUTES;
FABRICATION PROCESS;
FIELD-EFFECT DEVICES;
LATERAL DIMENSION;
SILICON SURFACE MORPHOLOGY;
TETRAMETHYL AMMONIUM HYDROXIDE;
TOP-DOWN FABRICATION;
ULTRATHIN SILICON;
SILICON WAFERS;
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EID: 84902440811
PISSN: 20507534
EISSN: 20507526
Source Type: Journal
DOI: 10.1039/c4tc00046c Document Type: Article |
Times cited : (13)
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References (28)
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