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Applied Physics Letters

Volumn 104, Issue 21, 2014, Pages

Quantitative non-contact voltage profiling of quasi one-dimensional nanoelectronic devices

(4) Jeong, Huiseong a Ahn, Y H a Lee, Soonil a Park, Ji Yong a

a Ajou University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

NANOELECTRONICS; NANOWIRES;

CALIBRATION PROCEDURE; CONTACT POTENTIAL; ELECTRICAL CHARACTERIZATION; ELECTROSTATIC FORCE MICROSCOPY; INTRINSIC RESISTIVITY; NANOELECTRONIC DEVICES; QUASI-ONE-DIMENSIONAL; VOLTAGE DISTRIBUTION;

ELECTRIC PROPERTIES;

EID: 84901803419 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4880733 Document Type: Article

Times cited : (7)

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