Local electrical characteristics of dielectrophoretically deposited carbon nanotubes

Journal of Nanoscience and Nanotechnology

Volumn 11, Issue 2, 2011, Pages 1791-1794

  Jeong, Huiseong ^a   Kang, Hosung ^b   Baik, Seunghyun ^b,c   Park, Ji Yong ^a  

^a Ajou University   (South Korea)

^b Sungkyunkwan University   (South Korea)

^c Sungkyunkwan University   (South Korea)

Author keywords

Carbon nanotube; Dielectrophoresis; Scanning probe microscopy

Indexed keywords

ALTERNATING CURRENT DIELECTROPHORESIS; DEPOSITED CARBON NANOTUBES; DEVICE RESISTANCE; ELECTRICAL CHARACTERISTIC; ELECTROSTATIC FORCE MICROSCOPY; GATE DEPENDENCE; HIGH SPATIAL RESOLUTION; SCANNING GATE MICROSCOPY; SCANNING PROBES;

ELECTROPHORESIS; SCANNING PROBE MICROSCOPY;

CARBON NANOTUBES;

EID: 84863040786     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2011.3398     Document Type: Conference Paper

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