Wavefront metrology measurements at SACLA by means of X-ray grating interferometry

Optics Express

Volumn 22, Issue 8, 2014, Pages 9004-9015

  Kayser, Yves ^a   Rutishauser, Simon ^a   Katayama, Tetsuo ^b   Ohashi, Haruhiko ^b   Kameshima, Takashi ^b   Flechsig, Uwe ^a   Yabashi, Makina ^c   David, Christian ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c RIKEN SPring 8 Center   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FREE ELECTRON LASERS; INTERFEROMETRY; MIRRORS; UNITS OF MEASUREMENT; WAVEFRONTS;

DOUBLE CRYSTAL MONOCHROMATORS; GRATING INTERFEROMETRY; OPTICAL COMPONENTS; SYNCHROTRON SOURCE; TECHNICAL PROGRESS; WAVEFRONT METROLOGY; X-RAY FREE ELECTRON LASERS; X-RAY WAVEFRONTS;

X RAYS;

EID: 84898985756     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.009004     Document Type: Article

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