Moiré interferometry formulas for hard X-ray wavefront sensing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5533, Issue , 2004, Pages 140-144

  Weitkamp, Timm ^a   Diaz, Ana ^a   Nöhammer, Bernd ^a   Pfeiffer, Franz ^a   Stampanoni, Marco ^a   Ziegler, Eric ^b   David, Christian ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Mirror metrology; Moir interferometry; Synchrotron radiation; X ray interferometry; X ray optics

Indexed keywords

ADSORPTION; DIFFRACTION GRATINGS; INTERFEROMETRY; OPTICS; SYNCHROTRON RADIATION; WAVEFRONTS; X RAYS;

MIRROR METROLOGY; MOIRE INTERFEROMETRY; X-RAY INTERFEROMETRY; X-RAY OPTICS;

MOIRE FRINGES;

EID: 15744383377     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559695     Document Type: Conference Paper

References (4)

1. C. David, B. Nöhammer, H. H. Solak, and E. Ziegler, "Differential x-ray phase contrast imaging using a shearing interferometer," Appl. Phys. Lett. 81, pp. 3287-3289, 2002.
2. T. Weitkamp, B. Nöhammer, A. Diaz, C. David, and E. Ziegler, "X-ray wavefront and optics characterization with a grating interferometer," 2004. submitted for publication.
3. T. Weitkamp, A. Diaz, B. Nöhammer, F. Pfeiffer, T. Rohbeck, P. Cloetens, M. Stampanoni, and C. David, "Hard X-ray phase imaging and tomography with a grating interferometer," in Developments in X-ray Tomography IV, U. Bonse, ed., Proceedings SPIE 5535, SPIE, (Bellingham, WA). in the press (conference venue and date: Denver, CO, 4-6 August 2004).
4. M. Born and E. Wolf, Principles of Optics, Pergamon Press, Oxford, England, sixth ed., 1993.