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Volumn 37, Issue 24, 2012, Pages 5046-5048

Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser

(14) Nilsson, Daniel a Uhlén, Fredrik a Holmberg, Anders a Hertz, Hans M a Schropp, Andreas b,c Patommel, Jens c Hoppe, Robert c Seiboth, Frank c Meier, Vivienne c Schroer, Christian G c Galtier, Eric b Nagler, Bob b Lee, Hae Ja b Vogt, Ulrich a

a ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

b SLAC NATIONAL ACCELERATOR LABORATORY (United States)

c DRESDEN UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENT ORDER; FAR FIELD; FOCUSING OPTICS; FRESNEL ZONE PLATE; HARD X RAY; INTERFERENCE FRINGE; LINAC COHERENT LIGHT SOURCE; NANO-FOCUSING; RONCHI TEST; SINGLE-SHOT;

LASERS; LIGHT SOURCES;

OPTICS;

ALGORITHM; ARTICLE; ELECTRON; EQUIPMENT; EQUIPMENT FAILURE; LASER; LIGHT; METHODOLOGY; NANOTECHNOLOGY; OPTICAL INSTRUMENTATION; RADIATION SCATTERING; REFRACTOMETRY; X RAY;

ALGORITHMS; ELECTRONS; EQUIPMENT FAILURE ANALYSIS; LASERS; LENSES; LIGHT; NANOTECHNOLOGY; REFRACTOMETRY; SCATTERING, RADIATION; X-RAYS;

EID: 84871311756 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.37.005046 Document Type: Article

Times cited : (20)

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