Single-shot beam-position monitor for x-ray free electron laser

Review of Scientific Instruments

Volumn 82, Issue 2, 2011, Pages

  Tono, Kensuke ^a   Kudo, Togo ^b   Yabashi, Makina ^a   Tachibana, Takeshi ^c   Feng, Yiping ^d   Fritz, David ^d   Hastings, Jerome ^d   Ishikawa, Tetsuya ^a  

^a SPring 8RIKEN ^*  (Japan)

^b Synchrotron Radiation Research Institute   (Japan)

^c KOBE STEEL LTD   (Japan)

^d SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACK-SCATTERED; BEAM INTENSITY; BEAM PATH; BEAM POSITIONS; HIGH DOSE; PIN PHOTODIODE; POSITION MONITOR; PROOF-OF-PRINCIPLE EXPERIMENTS; RADIATION PROPERTIES; SIGNAL INTENSITIES; SINGLE-SHOT; SYNCHROTRON LIGHT SOURCE; X RAY BEAM; X RAY PULSE; X-RAY FREE ELECTRON LASERS;

DIAMOND FILMS; DIAMONDS; ELECTRONS; HETEROJUNCTION BIPOLAR TRANSISTORS; LASERS; LIGHT SOURCES; PHOTODIODES; PLASMA DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SYNCHROTRON RADIATION; X RAYS;

FREE ELECTRON LASERS;

EID: 79952144817     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3549133     Document Type: Article

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