Full spatial characterization of a nanofocused X-ray free-electron laser beam by ptychographic imaging

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Schropp, Andreas ^a,b   Hoppe, Robert ^a   Meier, Vivienne ^a   Patommel, Jens ^a   Seiboth, Frank ^a   Lee, Hae Ja ^b   Nagler, Bob ^b   Galtier, Eric C ^b   Arnold, Brice ^b   Zastrau, Ulf ^b   Hastings, Jerome B ^b   Nilsson, Daniel ^c   Uhlén, Fredrik ^c   Vogt, Ulrich ^c   Hertz, Hans M ^c   Schroer, Christian G ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84886406092     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep01633     Document Type: Article

References (35)

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