Phase measurement error in summation of electron holography series

Ultramicroscopy

Volumn 141, Issue , 2014, Pages 38-50

  McLeod, Robert A ^a,b   Bergen, Michael ^b   Malac, Marek ^a,b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Complex circular random variables; Microscope instabilities; Off axis electron holography; Phase error; Phase resolution; Quantitative electron microscopy; Random walk; Specimen drift; TEM optimization; Transmission electron microscope

Indexed keywords

ELECTRON HOLOGRAPHY; ELECTRONS; ERRORS; FORECASTING; IMAGE RESOLUTION; LITHOGRAPHY; MAGNETIC PROPERTIES; MAGNETISM; PHASE MEASUREMENT; RANDOM PROCESSES; TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSIONS; TUNGSTEN COMPOUNDS; WAVEFRONTS;

OFF-AXIS ELECTRON HOLOGRAPHY; PHASE ERROR; PHASE RESOLUTION; QUANTITATIVE ELECTRON MICROSCOPY; RANDOM WALK; SPECIMEN DRIFT;

HOLOGRAMS;

ARTICLE; COMPUTER PREDICTION; ELECTRON HOLOGRAPHY; ELECTRON MICROSCOPE; HOLOGRAPHY; IMAGE REGISTRATION; IMAGING AND DISPLAY; INFORMATION PROCESSING; LINEAR SYSTEM; MEASUREMENT ACCURACY; MEASUREMENT ERROR; PRISM; PROCESS OPTIMIZATION; SENSITIVITY ANALYSIS; SPATIAL ANALYSIS; SPATIAL SUMMATION; TRANSMISSION ELECTRON MICROSCOPE;

EID: 84897937344     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.03.001     Document Type: Article

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