메뉴 건너뛰기




Volumn 118, Issue , 2012, Pages 21-25

Improvement of the accuracy of phase observation by modification of phase-shifting electron holography

Author keywords

Electron holography; Phase reconstruction; Phase shifting

Indexed keywords

MEAN INTENSITY; PHASE OBSERVATIONS; PHASE RECONSTRUCTION; PHASE-SHIFTING; TIME VARIATIONS;

EID: 84862306313     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.04.007     Document Type: Article
Times cited : (31)

References (16)
  • 1
    • 0002387674 scopus 로고
    • Electron-holographic interference microscopy
    • Tonomura A. Electron-holographic interference microscopy. Advances in Physics 1992, 41:59-103.
    • (1992) Advances in Physics , vol.41 , pp. 59-103
    • Tonomura, A.1
  • 2
    • 80052049900 scopus 로고    scopus 로고
    • Electron holography study of electric field variations
    • Shindo D., Murakami Y. Electron holography study of electric field variations. Journal of Electron Microscopy 2011, 60:S225-S237.
    • (2011) Journal of Electron Microscopy , vol.60
    • Shindo, D.1    Murakami, Y.2
  • 4
    • 38349092033 scopus 로고    scopus 로고
    • Performance limits of electron holography
    • Lichte H. Performance limits of electron holography. Ultramicroscopy 2008, 108:256-262.
    • (2008) Ultramicroscopy , vol.108 , pp. 256-262
    • Lichte, H.1
  • 5
    • 77952320263 scopus 로고    scopus 로고
    • Approaching routine 2π/1000 phase resolution for off-axis type holography
    • Voelkl E., Tang D. Approaching routine 2π/1000 phase resolution for off-axis type holography. Ultramicroscopy 2010, 110:447-459.
    • (2010) Ultramicroscopy , vol.110 , pp. 447-459
    • Voelkl, E.1    Tang, D.2
  • 6
    • 0037257195 scopus 로고    scopus 로고
    • Evaluation of high-precision phase-shifting electron holography by using hologram simulation
    • Yamamoto K., Hirayama T., Tanji T., Hibino M. Evaluation of high-precision phase-shifting electron holography by using hologram simulation. Surface and Interface Analysis 2003, 35:60-65.
    • (2003) Surface and Interface Analysis , vol.35 , pp. 60-65
    • Yamamoto, K.1    Hirayama, T.2    Tanji, T.3    Hibino, M.4
  • 10
    • 0028484680 scopus 로고
    • Principle and application of phase-shifting electron holography
    • Ru Q., Lai G., Aoyama K., Endo J., Tonomura A. Principle and application of phase-shifting electron holography. Ultramicroscopy 1994, 55:209-220.
    • (1994) Ultramicroscopy , vol.55 , pp. 209-220
    • Ru, Q.1    Lai, G.2    Aoyama, K.3    Endo, J.4    Tonomura, A.5
  • 11
    • 33646020992 scopus 로고    scopus 로고
    • Reconstruction technique for off-axis electron holography using coarse fringes
    • Fujita T., Yamamoto K., McCartney M.R., Smith D.J. Reconstruction technique for off-axis electron holography using coarse fringes. Ultramicroscopy 2006, 106:486-491.
    • (2006) Ultramicroscopy , vol.106 , pp. 486-491
    • Fujita, T.1    Yamamoto, K.2    McCartney, M.R.3    Smith, D.J.4
  • 14
    • 27544500664 scopus 로고
    • Field emission current instability induced by migrating atoms on W(310) surface
    • Yamamoto S., Saitou N., Fukuhara S. Field emission current instability induced by migrating atoms on W(310) surface. Surface Science 1978, 71:191-198.
    • (1978) Surface Science , vol.71 , pp. 191-198
    • Yamamoto, S.1    Saitou, N.2    Fukuhara, S.3
  • 16
    • 0026911058 scopus 로고
    • Electron holography in the study of the electrostatic field: the case of charged microtips
    • Matteucci G., Missiroli G.F., Muccini M., Pozzi G. Electron holography in the study of the electrostatic field: the case of charged microtips. Ultramicroscopy 1992, 45:77-83.
    • (1992) Ultramicroscopy , vol.45 , pp. 77-83
    • Matteucci, G.1    Missiroli, G.F.2    Muccini, M.3    Pozzi, G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.