A holographic method to measure the source size broadening in STEM

Ultramicroscopy

Volumn 120, Issue , 2012, Pages 35-40

  Verbeeck, Jo ^a   Béché, Armand ^a,b   Van den Broek, Wouter ^a,c  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b Thermo Fisher Scientific   (United States)

^c UNIVERSITY OF ULM   (Germany)

Author keywords

Coherence; Holography; Source size broadening; STEM

Indexed keywords

ALTERNATIVE METHODS; BIPRISM; BIVARIATE; CAUCHY DISTRIBUTION; FIXED WIDTH; GAUSSIAN PROFILES; GAUSSIANS; HOLOGRAPHIC METHOD; IMAGE CONTRASTS; INTER-ATOMIC DISTANCES; INTERFERENCE PATTERNS; LIMITING EFFECTS; LINEAR COMBINATIONS; QUANTITATIVE COMPARISON; RONCHIGRAMS; SOURCE SIZES; STEM;

COHERENT LIGHT; EXPERIMENTS; GAUSSIAN DISTRIBUTION;

HOLOGRAPHY;

ARTICLE; CALCULATION; FOURIER TRANSFORMATION; HOLOGRAPHY; INTERMETHOD COMPARISON; MEASUREMENT; NORMAL DISTRIBUTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION; STATIC ELECTRICITY;

EID: 84864037369     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.05.007     Document Type: Article

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