High precision phase-shifting electron holography

Journal of Electron Microscopy

Volumn 49, Issue 1, 2000, Pages 31-39

  Yamamoto, Kazuo ^a   Kawajiri, Ikuo ^a   Tanji, Takayoshi ^a   Hibino, Michio ^a   Hirayama, Tsukasa ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

Fresnel correction; Highly precise phase measurement technique; Phase shifting electron holography; Weak electric fields; Weak magnetic fields

Indexed keywords

ELECTRON HOLOGRAPHY; ELECTRONS; HOLOGRAMS; MAGNETIC FIELDS; PHASE MEASUREMENT;

FRESNEL; FRESNEL CORRECTION; HIGH-PRECISION; HIGHLY PRECISE PHASE MEASUREMENT TECHNIQUE; INFORMATION-ORIENTED SOCIETY; MEASUREMENT TECHNIQUES; PHASE-SHIFTING; WEAK ELECTRIC FIELD; WEAK MAGNETIC FIELDS;

ELECTRIC FIELDS;

EID: 0034031243     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023789     Document Type: Article

References (16)

1. Boersch H, Hamisch H, Wohlleben D, and Grohmann K (1960) Antiparallele Weißsche Bereiche als Biprisma fur Elektroneinterferenzen, Z. Physik. 159: 397-404.
2. Tonomura A, Matsuda T, Endo J, Todokoro H, and Komoda T (1979) Development of a field emission electron microscope. J.Electron Microsc. 28: 1-11.
3. Hirayama T, Chen J, Ru Q, Ishizuka K, Tanji T, and Tonomura A (1994) Observation of single magnetic-domain particles by electron holographic microscopy. J. Electron Microsc. 43: 190-197
4. Hirayama T, Ru Q, Tanji T, and Tonomura A (1993) Observation of magnetic-domain states of barium ferrite particles by electron holography. Appl. Phys. Lett. 63: 418-420.
5. Lichte H (1991) Electron image plane off-axis holography of atomic structures. Adv. Opt. Electron Microsc. 12: 25-91.
6. Tonomura A, Matsuda T, Kawasaki T, Endo J, and Osakabe N (1985) Sensitivity-enhanced electron-holographic interferometry and thickness-measurement applications at atomic scale. Phys. Rev. Lett. 54: 60-62.
7. Ru Q, Endo J, Tanji T, and Tonomura A (1991) Phase-shifting electron holography by beam tilting. Appl. Phys. Lett. 59: 2372-2374.
8. Ru Q, Lai G, Aoyama K, Endo J, and Tonomura A (1994) Principle and application of phase-shifting electron holography. Ultramicroscopy 55: 209-220.
9. Pozzi G (1975) Asymptotic approximation of the image wavefunction in interference electron microscopy. Optik 42: 97-102.
10. Pozzi G (1980) Asymptotic approximation of the image wavefunction in interference electron microscopy. II. Extension to the biprism edges. Optik 56: 243-250.
11. Shirota K, Yonezawa A, Shibatomi K, and Yanaka T (1976) Ferro-magnetic material observation lens system for CTEM with a eucentric goniometer. J. Electron Microsc. 25: 303-304.
12. Matteucci G, Missiroli G F, Muccini M, and Pozzi G (1992) Electron holography in the study of the electrostatic fields: the case of charged microtips. Ultramicroscopy 45: 77-83.
13. Frost B G, Allard L F, Volkl E, and Joy D C (1995) Holography of electrostatic fields. In: Electron Holography, eds Tonomura A et al., pp. 169-179, (Elsevier, Amsterdam).
14. Hirayama T, Lai G, Tanji T, Tanaka N, and Tonomura A (1997) Interference of three electron waves by two biprisms and its application to direct visualization of electromagnetic fields in small regions. J. Appl. Phys. 82: 522-527.
15. Aharanov Y and Bohm D (1959) Significance of electromagnetic potentials in the quantum theory. Phys. Rev. 115: 485-491.
16. Hirayama T, Osakabe N, Ru Q, Tanji T, and Tonomura A (1995) Electron holographic interference micrograph of a single magnetic-domain particle. Jap. J. Appl. Phys. 34: 3294-3297.