Tutorial on off-axis electron holography

Microscopy and Microanalysis

Volumn 8, Issue 6, 2002, Pages 447-466

  Lehmann, Michael ^a   Lichte, Hannes ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

2D dopant profiling; Correction of aberrations; Exit wave reconstruction; Off axis electron holography; Quantitative evaluation of exit wave; Wave optics

Indexed keywords

ELECTRON MICROSCOPY; HOLOGRAPHY; METHODOLOGY; REPRODUCIBILITY; REVIEW; SENSITIVITY AND SPECIFICITY; THEORETICAL MODEL;

HOLOGRAPHY; MICROSCOPY, ELECTRON; MODELS, THEORETICAL; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 0036933483     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927602029938     Document Type: Review

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