Comparison of approaches and artefacts in the measurement of detector modulation transfer functions

Ultramicroscopy

Volumn 129, Issue , 2013, Pages 18-29

  Boothroyd, C B ^a   Kasama, T ^b   Dunin Borkowski, R E ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Charge coupled device camera; Modulation transfer function; Point spread function

Indexed keywords

ACCURATE MEASUREMENT; CIRCULAR APERTURE; DIRECT MEASUREMENT; HOLOGRAPHIC INTERFERENCE; IMAGE CONTRASTS; MEASUREMENTS OF; REPRODUCIBILITIES; TRANSMISSION ELECTRON MICROSCOPE;

CAMERAS; CCD CAMERAS; MAMMOGRAPHY; MODULATION; TRANSMISSION ELECTRON MICROSCOPY;

OPTICAL TRANSFER FUNCTION;

ACCURACY; ANALYTICAL PARAMETERS; ARTICLE; CAMERA; CONTROLLED STUDY; DETECTOR MODULATION TRANSFER FUNCTIONS; IMAGE CONTRAST; IMAGING AND DISPLAY; INTERMETHOD COMPARISON; MEASUREMENT; REPRODUCIBILITY; SENSITIVITY ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84875782038     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.03.001     Document Type: Article

References (22)

1. Boothroyd C.B. Ultramicroscopy 2000, 83:159-168.
2. Zuo J.M. Ultramicroscopy 1996, 66:21-33.
3. Zuo J.M. Microscopy Research and Technique 2000, 49:245-268.
4. Meyer R.R., Kirkland A.I. Microscopy Research and Technique 2000, 49:269-280.
5. Meyer R.R., Kirkland A.I., Dunin-Borkowski R.E., Hutchison J.L. Ultramicroscopy 2000, 85:9-13.
6. Meyer R.R., Kirkland A. Ultramicroscopy 1998, 75:23-33.
7. Niermann T., Lubk A., Röder F. Ultramicroscopy 2012, 115:68-77.
8. Nakashima P.N.H., Johnson A.W.S. Ultramicroscopy 2003, 94:135-148.
9. Van den Broek W., Van Aert S., Van Dyck D. Microscopy and Microanalysis 2012, 18:336-342.
10. Erni R., Rossell M.D., Nakashima P.N.H. Ultramicroscopy 2010, 110:151-161.
11. Lubk A., Röder F., Niermann T., Gatel C., Joulie S., Houdellier F., Magen C., Hÿtch M. Ultramicroscopy 2012, 115:78-87.
12. Holton J., Nielsen C., Frankel K. Journal of Synchrotron Radiation 2012, 19:1006-1011.
13. Soehnel G., Tanbakuchi A. Applied Optics 2012, 51:7987.
14. de Ruijter W.J., Weiss J.K. Review of Scientific Instruments 1992, 63:4314-4321.
15. McMullan G., Chen S., Henderson R., Faruqi A.R. Ultramicroscopy 2009, 109:1126-1143.
16. P. Grob, D. Bean, D. Typke, X. Li, E. Nogales, R.M. Glaeser, Ultramicroscopy, , in press. http://dx.doi.org/10.1016/j.ultramic.2013.01.003.
17. Hÿtch M.J., Stobbs W.M. Ultramicroscopy 1994, 53:191-203.
18. Howie A. Ultramicroscopy 2004, 98:73-79.
19. Thust A. Physical Review Letters 2009, 102:220801.
20. Boothroyd C.B. Journal of Microscopy 1998, 190:99-108.
21. Boothroyd C.B. Ultramicroscopy 2000, 83:159-168.
22. Boothroyd C.B., Dunin-Borkowski R.E. Ultramicroscopy 2004, 98:115-133.