On the optical stability of high-resolution transmission electron microscopes

Ultramicroscopy

Volumn 134, Issue , 2013, Pages 6-17

  Barthel, J ^a,b   Thust, A ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Aberration correction; Aberrations; Astigmatism; Electron optics; HRTEM; Optical lifetime; Stability

Indexed keywords

ABERRATION CORRECTION; ABERRATION CORRECTORS; ABERRATION-CORRECTED; ASTIGMATISM; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; HRTEM; OPTICAL LIFETIME; STATISTICAL FRAMEWORK;

ABERRATIONS; CONVERGENCE OF NUMERICAL METHODS; ELECTRON OPTICS; MICROSCOPIC EXAMINATION; MOLECULAR PHYSICS;

TRANSMISSION ELECTRON MICROSCOPY;

ACCELERATING VOLTAGE; ANALYTICAL PARAMETERS; ARTICLE; ASTIGMATISM; CONCEPTUAL FRAMEWORK; ELECTRIC POTENTIAL; ELECTRON MICROSCOPE; IMAGE QUALITY; OPERATOR; OPTICAL LIFETIME; OPTICAL RESOLUTION; OPTICAL STABILITY; PROBABILITY; PROCESS OPTIMIZATION; QUALITY CONTROL PROCEDURES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STATISTICAL ANALYSIS;

ABERRATION CORRECTION; ABERRATIONS; ASTIGMATISM; ELECTRON OPTICS; HRTEM; OPTICAL LIFETIME; STABILITY;

MICROSCOPY, ELECTRON, TRANSMISSION;

EID: 84883552983     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.05.001     Document Type: Article

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