The effect of mechanical vibration and drift on the reconstruction of exit waves from a through focus series of HREM images

Ultramicroscopy

Volumn 80, Issue 4, 1999, Pages 255-269

  Bokel, R M J ^a   Jansen, J ^a   Van Dyck, D ^b   Zandbergen, H W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Electron microscope design and characterisation; Exit wave reconstruction; High resolution transmission electron microscopy

Indexed keywords

HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; LEAST SQUARES APPROXIMATIONS; TRANSMISSION ELECTRON MICROSCOPY; VIBRATIONS (MECHANICAL);

EXIT WAVE RECONSTRUCTION;

IMAGE RECONSTRUCTION;

ARTICLE; IMAGE RECONSTRUCTION; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY; VIBRATION; WAVEFORM;

EID: 0032729301     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00116-3     Document Type: Article

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