Double-biprism electron interferometry

Applied Physics Letters

Volumn 84, Issue 17, 2004, Pages 3229-3231

  Harada, Ken ^a,b   Tonomura, Akira ^a,b   Togawa, Yoshihiko ^a   Akashi, Tetsuya ^b   Matsuda, Tsuyoshi ^a,b  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COATINGS; ELECTRODES; ELECTRON HOLOGRAPHY; FUNCTIONS; HOLOGRAPHIC INTERFEROMETRY; IMAGE ANALYSIS; LENSES; OPTICAL SYSTEMS; PARAMETER ESTIMATION; PRISMS;

DOUBLE-BIPRISMS; ELECTRON INTERFEROMETRY; IMAGE PLANES; MAGNIFYING LENSES;

ELECTRONS;

EID: 2542485596     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1715155     Document Type: Article

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