Determination of localized visibility in off-axis electron holography

Ultramicroscopy

Volumn 138, Issue , 2014, Pages 4-12

  McLeod, Robert A ^a,b   Kupsta, Martin ^b   Malac, Marek ^a,b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

2 D histogram; Coherence loss; Composition mapping; Electron coherence; Electron holography; Fringe contrast; Holographic visibility; Incoherent scattering; Transmission electron microscope (TEM)

Indexed keywords

2-D HISTOGRAMS; COHERENCE LOSS; ELECTRON COHERENCE; FRINGE CONTRASTS; INTERFERENCE METHODS; MAXIMUM INTENSITIES; OFF-AXIS ELECTRON HOLOGRAPHY; WAVEFRONT COHERENCE;

ELECTRON HOLOGRAPHY; ELECTRONS; GERMANIUM; GOLD; GRAPHIC METHODS; INCOHERENT SCATTERING; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY; UNDERWATER ACOUSTICS; WAVEFRONTS;

VISIBILITY;

ALUMINUM; CALCIUM; CHROMIUM; COPPER; GERMANIUM; GOLD; SILICON; TITANIUM;

ALGORITHM; ARTICLE; CONTROLLED STUDY; FOURIER TRANSFORMATION; HISTOGRAM; HOLOGRAPHY; LOCAL VISIBILITY; MATHEMATICAL ANALYSIS; MEASUREMENT; NOISE; OFF AXIS ELECTRON HOLOGRAPHY; QUANTITATIVE ANALYSIS; RECTANGULAR HAMMING WINDOW; SHOT NOISE; TWO DIMENSIONAL DISCRETE FOURIER TRANSFORM;

EID: 84890909159     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.11.005     Document Type: Article

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