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Review of Scientific Instruments

Volumn 85, Issue 2, 2014, Pages

A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope

(4) Steurer, Wolfram a Gross, Leo a Schlittler, Reto R a Meyer, Gerhard a

a IBM RESEARCH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84894127148 PISSN: 00346748 EISSN: 10897623 Source Type: Journal
DOI: 10.1063/1.4864296 Document Type: Article

Times cited : (6)

References (32)

1
- 0032606877
- 10.1063/1.124777
- M. M. Deshmukh, D. C. Ralph, M. Thomas, and J. Silcox, Appl. Phys. Lett. 75, 1631 (1999). 10.1063/1.124777
- (1999) Appl. Phys. Lett. , vol.75 , pp. 1631
- Deshmukh, M.M.¹ Ralph, D.C.² Thomas, M.³ Silcox, J.⁴

2
- 0037450241
- 10.1063/1.1554483
- A. R. Champagne, A. J. Couture, F. Kuemmeth, and D. C. Ralph, Appl. Phys. Lett. 82, 1111 (2003). 10.1063/1.1554483
- (2003) Appl. Phys. Lett. , vol.82 , pp. 1111
- Champagne, A.R.¹ Couture, A.J.² Kuemmeth, F.³ Ralph, D.C.⁴

3
- 13744259389
- 10.1063/1.1852925
- P. Zahl, M. Bammerlin, G. Meyer, and R. R. Schlittler, Rev. Sci. Instrum. 76, 023707 (2005). 10.1063/1.1852925
- (2005) Rev. Sci. Instrum. , vol.76 , pp. 023707
- Zahl, P.¹ Bammerlin, M.² Meyer, G.³ Schlittler, R.R.⁴

4
- 51149202246
- 10.1063/1.107150
- R. Allenspach, A. Bischof, M. Stampanoni, D. Kerkmann, and D. Pescia, Appl. Phys. Lett. 60, 1908 (1992). 10.1063/1.107150
- (1992) Appl. Phys. Lett. , vol.60 , pp. 1908
- Allenspach, R.¹ Bischof, A.² Stampanoni, M.³ Kerkmann, D.⁴ Pescia, D.⁵

5
- 0030123746
- 10.1143/JJAP.35.2369
- K. Ono, H. Shimada, S.-i. Kobayashi, and Y. Ootuka, Jpn. J. Appl. Phys. 35, 2369 (1996). 10.1143/JJAP.35.2369
- (1996) Jpn. J. Appl. Phys. , vol.35 , pp. 2369
- Ono, K.¹ Shimada, H.² Kobayashi, S.-I.³ Ootuka, Y.⁴

6
- 33847215116
- 10.1007/s10853-006-1046-z
- J. Lee, B. Ju, J. Jang, Y. Yoon, and J. Kim, J. Mater. Sci. 42, 1026 (2007). 10.1007/s10853-006-1046-z
- (2007) J. Mater. Sci. , vol.42 , pp. 1026
- Lee, J.¹ Ju, B.² Jang, J.³ Yoon, Y.⁴ Kim, J.⁵

7
- 77957124564
- 10.1016/j.sna.2010.04.016
- K. Sidler, N. V. Cvetkovic, V. Savu, D. Tsamados, A. M. Ionescu, and J. Brugger, Sens. Actuators, A 162, 155 (2010). 10.1016/j.sna.2010.04.016
- (2010) Sens. Actuators, A , vol.162 , pp. 155
- Sidler, K.¹ Cvetkovic, N.V.² Savu, V.³ Tsamados, D.⁴ Ionescu, A.M.⁵ Brugger, J.⁶

8
- 10944253235
- 10.1021/jp047023a
- J. A. Merlo and C. D. Frisbie, J. Phys. Chem. B 108, 19169 (2004). 10.1021/jp047023a
- (2004) J. Phys. Chem. B , vol.108 , pp. 19169
- Merlo, J.A.¹ Frisbie, C.D.²

9
- 54249103701
- 10.1143/JJAP.47.1797
- T. Uchihashi, U. Ramsperger, T. Nakayama, and M. Aono, Jpn. J. Appl. Phys. 47, 1797 (2008). 10.1143/JJAP.47.1797
- (2008) Jpn. J. Appl. Phys. , vol.47 , pp. 1797
- Uchihashi, T.¹ Ramsperger, U.² Nakayama, T.³ Aono, M.⁴

10
- 77952963759
- 10.1116/1.3292601
- L. Gross, R. R. Schlittler, G. Meyer, L. A. Fendt, F. Diederich, T. Glatzel, S. Kawai, S. Koch, and E. Meyer, J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. 28, C4D34 (2010). 10.1116/1.3292601
- (2010) J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. , vol.28
- Gross, L.¹ Schlittler, R.R.² Meyer, G.³ Fendt, L.A.⁴ Diederich, F.⁵ Glatzel, T.⁶ Kawai, S.⁷ Koch, S.⁸ Meyer, E.⁹

11
- 77949346988
- 10.1116/1.3292630
- V. Savu, S. Neuser, G. Villanueva, O. Vazquez-Mena, K. Sidler, and J. Brugger, J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. 28, 169 (2010). 10.1116/1.3292630
- (2010) J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. , vol.28 , pp. 169
- Savu, V.¹ Neuser, S.² Villanueva, G.³ Vazquez-Mena, O.⁴ Sidler, K.⁵ Brugger, J.⁶

12
- 33847656522
- 10.1063/1.2710202
- L. Gross, R. R. Schlittler, G. Meyer, A. Vanhaverbeke, and R. Allenspach, Appl. Phys. Lett. 90, 093121 (2007). 10.1063/1.2710202
- (2007) Appl. Phys. Lett. , vol.90 , pp. 093121
- Gross, L.¹ Schlittler, R.R.² Meyer, G.³ Vanhaverbeke, A.⁴ Allenspach, R.⁵

13
- 77957300852
- 10.1088/0957-4484/21/32/325301
- L. Gross, R. R. Schlittler, G. Meyer, and R. Allenspach, Nanotechnology 21, 325301 (2010). 10.1088/0957-4484/21/32/325301
- (2010) Nanotechnology , vol.21 , pp. 325301
- Gross, L.¹ Schlittler, R.R.² Meyer, G.³ Allenspach, R.⁴

14
- 58149279809
- 10.1021/nl801778t
- O. Vazquez-Mena, G. Villanueva, V. Savu, K. Sidler, M. A. F. van den Boogaart, and J. Brugger, Nano Lett. 8, 3675 (2008). 10.1021/nl801778t
- (2008) Nano Lett. , vol.8 , pp. 3675
- Vazquez-Mena, O.¹ Villanueva, G.² Savu, V.³ Sidler, K.⁴ Van Den Boogaart, M.A.F.⁵ Brugger, J.⁶

15
- 84874829320
- 10.1088/0953-8984/22/8/084025
- C. Joachim, D. Martrou, M. Rezeq, C. Troadec, D. Jie, N. Chandrasekhar, and S. Gauthier, J. Phys.: Condens. Matter 22, 084025 (2010). 10.1088/0953-8984/22/8/084025
- (2010) J. Phys.: Condens. Matter , vol.22 , pp. 084025
- Joachim, C.¹ Martrou, D.² Rezeq, M.³ Troadec, C.⁴ Jie, D.⁵ Chandrasekhar, N.⁶ Gauthier, S.⁷

16
- 33745899020
- 10.1002/adfm.200500933
- E. Speets, P. te Riele, M. van den Boogaart, L. Doeswijk, B. Ravoo, G. Rijnders, J. Brugger, D. Reinhoudt, and D. Blank, Adv. Funct. Mater. 16, 1337 (2006). 10.1002/adfm.200500933
- (2006) Adv. Funct. Mater. , vol.16 , pp. 1337
- Speets, E.¹ Te Riele, P.² Van Den Boogaart, M.³ Doeswijk, L.⁴ Ravoo, B.⁵ Rijnders, G.⁶ Brugger, J.⁷ Reinhoudt, D.⁸ Blank, D.⁹

17
- 0242319673
- 10.1021/nl034512y
- Y. X. Zhou, A. T. Johnson, J. Hone, and W. F. Smith, Nano Lett. 3, 1371 (2003). 10.1021/nl034512y
- (2003) Nano Lett. , vol.3 , pp. 1371
- Zhou, Y.X.¹ Johnson, A.T.² Hone, J.³ Smith, W.F.⁴

18
- 44149126460
- 10.1016/j.mee.2007.12.069
- K. Sidler, O. Vazquez-Mena, V. Savu, G. Villanueva, M. van den Boogaart, and J. Brugger, Microelectron. Eng. 85, 1108 (2008). 10.1016/j.mee.2007.12.069
- (2008) Microelectron. Eng. , vol.85 , pp. 1108
- Sidler, K.¹ Vazquez-Mena, O.² Savu, V.³ Villanueva, G.⁴ Van Den Boogaart, M.⁵ Brugger, J.⁶

19
- 44149112584
- 10.1016/j.mee.2007.12.068
- G. Villanueva, O. Vazquez-Mena, M. van den Boogaart, K. Sidler, K. Pataky, V. Savu, and J. Brugger, Microelectron. Eng. 85, 1010 (2008). 10.1016/j.mee.2007.12.068
- (2008) Microelectron. Eng. , vol.85 , pp. 1010
- Villanueva, G.¹ Vazquez-Mena, O.² Van Den Boogaart, M.³ Sidler, K.⁴ Pataky, K.⁵ Savu, V.⁶ Brugger, J.⁷

20
- 44149094935
- 10.1116/1.584016
- S. W. Pang, M. W. Geis, W. D. Goodhue, N. N. Efremow, D. J. Ehrlich, R. B. Goodman, and J. N. Randall, J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. 6, 249 (1988). 10.1116/1.584016
- (1988) J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. , vol.6 , pp. 249
- Pang, S.W.¹ Geis, M.W.² Goodhue, W.D.³ Efremow, N.N.⁴ Ehrlich, D.J.⁵ Goodman, R.B.⁶ Randall, J.N.⁷

21
- 79960179827
- 10.1063/1.3600898
- B. Grévin, M. Fakir, J. Hayton, M. Brun, R. Demadrille, and J. Faure-Vincent, Rev. Sci. Instrum. 82, 063706 (2011). 10.1063/1.3600898
- (2011) Rev. Sci. Instrum. , vol.82 , pp. 063706
- Grévin, B.¹ Fakir, M.² Hayton, J.³ Brun, M.⁴ Demadrille, R.⁵ Faure-Vincent, J.⁶

22
- 0034205553
- 10.1016/S0167-9317(00)00343-9
- J. Brugger, J. Berenschot, S. Kuiper, W. Nijdam, B. Otter, and M. Elwenspoek, Microelectron. Eng. 53, 403 (2000). 10.1016/S0167-9317(00)00343-9
- (2000) Microelectron. Eng. , vol.53 , pp. 403
- Brugger, J.¹ Berenschot, J.² Kuiper, S.³ Nijdam, W.⁴ Otter, B.⁵ Elwenspoek, M.⁶

23
- 20844444306
- 10.1063/1.1923764
- C.-V. Cojocaru, C. Harnagea, F. Rosei, A. Pignolet, M. A. F. van den Boogaart, and J. Brugger, Appl. Phys. Lett. 86, 183107 (2005). 10.1063/1.1923764
- (2005) Appl. Phys. Lett. , vol.86 , pp. 183107
- Cojocaru, C.-V.¹ Harnagea, C.² Rosei, F.³ Pignolet, A.⁴ Van Den Boogaart, M.A.F.⁵ Brugger, J.⁶

24
- 12944295089
- 10.1021/nl0486822
- S. Egger, A. Ilie, Y. Fu, J. Chongsathien, D. Kang, and M. E. Welland, Nano Lett. 5, 15 (2005). 10.1021/nl0486822
- (2005) Nano Lett. , vol.5 , pp. 15
- Egger, S.¹ Ilie, A.² Fu, Y.³ Chongsathien, J.⁴ Kang, D.⁵ Welland, M.E.⁶

25
- 33744494079
- 10.1021/cc0501662
- S. Egger, S. Higuchi, and T. Nakayama, J. Comb. Chem. 8, 275 (2006). 10.1021/cc0501662
- (2006) J. Comb. Chem. , vol.8 , pp. 275
- Egger, S.¹ Higuchi, S.² Nakayama, T.³

26
- 70349665405
- 10.1088/0957-4484/20/41/415303
- O. Vazquez-Mena, L. G. Villanueva, V. Savu, K. Sidler, P. Langlet, and J. Brugger, Nanotechnology 20, 415303 (2009). 10.1088/0957-4484/20/41/415303
- (2009) Nanotechnology , vol.20 , pp. 415303
- Vazquez-Mena, O.¹ Villanueva, L.G.² Savu, V.³ Sidler, K.⁴ Langlet, P.⁵ Brugger, J.⁶

27
- 34548682605
- 10.1088/0957-4484/18/33/335301
- T. Tun, M. Lwin, H. Kim, N. Chandrasekhar, and C. Joachim, Nanotechnology 18, 335301 (2007). 10.1088/0957-4484/18/33/335301
- (2007) Nanotechnology , vol.18 , pp. 335301
- Tun, T.¹ Lwin, M.² Kim, H.³ Chandrasekhar, N.⁴ Joachim, C.⁵

28
- 44949134858
- 10.1088/0957-4484/19/28/285302
- A. Linklater and J. Nogami, Nanotechnology 19, 285302 (2008). 10.1088/0957-4484/19/28/285302
- (2008) Nanotechnology , vol.19 , pp. 285302
- Linklater, A.¹ Nogami, J.²

29
- 84894164353
- SPS-CreaTec GmbH, Magnusstr. 11, 12489 Berlin, Germany
- SPS-CreaTec GmbH, Magnusstr. 11, 12489 Berlin, Germany.

30
- 84894224146
- Attocube systems AG, Königinstrasse 11a, 80539 München, Germany
- Attocube systems AG, Königinstrasse 11a, 80539 München, Germany.

31
- 84894218235
- Noliac A/S, Hejreskovvej 18, 3490 Kvistgaard, Denmark
- Noliac A/S, Hejreskovvej 18, 3490 Kvistgaard, Denmark.

32
- 84894195556
- Aquamarijn Micro Filtration BV, Berkelkade 11, NL 7201 JE Zutphen, The Netherlands
- Aquamarijn Micro Filtration BV, Berkelkade 11, NL 7201 JE Zutphen, The Netherlands.

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