Nanostencil-fabricated electrodes for electron transport measurements of atomically thin nanowires in ultrahigh vacuum

Japanese Journal of Applied Physics

Volumn 47, Issue 3 PART 1, 2008, Pages 1797-1799

  Uchihashi, Takashi ^a,b   Ramsperger, Urs ^c   Nakayama, Tomonobu ^a,b   Aono, Masakazu ^a,b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c ETH ZURICH   (Switzerland)

Author keywords

Electrode; Nanowire; Scanning tunneling microscope; Shadow mask; Transport measurement; Ultrahigh vacuum

Indexed keywords

ELECTRIC WIRE; ELECTRODES; ELECTROLYSIS; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; ELECTRONS; ERBIUM; GALLIUM ALLOYS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; PIEZOELECTRIC ACTUATORS; SCANNING; SEMICONDUCTOR QUANTUM DOTS; SUGAR (SUCROSE); TUNNELING (EXCAVATION); ULTRAHIGH VACUUM; VACUUM DEPOSITION; VACUUM TECHNOLOGY;

DISILICIDE; ELECTRODE GAPS; ELECTRON TRANSPORT MEASUREMENTS; IN-SITU; METAL ELECTRODES; NANOSTENCIL; NANOSTENCILING; SHADOW MASK; SHADOW MASKS; TRANSPORT MEASUREMENT; TUNNELING MICROSCOPES; TWO TYPES;

VACUUM;

EID: 54249103701     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.1797     Document Type: Article

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