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Volumn 85, Issue 5-6, 2008, Pages 1010-1014
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Etching of sub-micrometer structures through Stencil
a
EPFL
(Switzerland)
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Author keywords
Reactive ion etching (RIE); Shadow mask; Stencil
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Indexed keywords
DEPOSITION;
LITHOGRAPHY;
REACTIVE ION ETCHING;
SHADOW MASK;
STENCIL LITHOGRAPHY (SL);
MICROMETERS;
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EID: 44149112584
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2007.12.068 Document Type: Article |
Times cited : (28)
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References (9)
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