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Volumn 82, Issue 7, 2003, Pages 1111-1113

Nanometer-scale scanning sensors fabricated using stencil lithography

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EVAPORATION; MASKS; NANOSTRUCTURED MATERIALS; SENSORS;

EID: 0037450241     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1554483     Document Type: Article
Times cited : (49)

References (24)
  • 18
    • 0012400091 scopus 로고    scopus 로고
    • MikroMash, Non-contact silicon cantilever NSC14
    • MikroMash, Non-contact silicon cantilever NSC14.
  • 22
    • 0012440778 scopus 로고    scopus 로고
    • Nanoprobe SPM tips, MESP 66-83 KHz
    • Nanoprobe SPM tips, MESP 66-83 KHz.
  • 23
    • 0012400968 scopus 로고    scopus 로고
    • note
    • The force gradient sensivity of a cantilever is proportional to √k/Qω, where k is the spring constant, Q is the quality factor, and ω is the resonant frequency of the cantilever.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.