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Volumn 294, Issue , 2014, Pages 95-99

Scaling of HfO 2 dielectric on CVD graphene

Author keywords

Atomic layer deposition; Chemical vapor deposition; Graphene; High k dielectrics; Thin films; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC LAYER DEPOSITION; ATOMS; CARBIDES; DIELECTRIC MATERIALS; GRAPHENE; HAFNIUM OXIDES; HIGH-K DIELECTRIC; THIN FILMS; VACUUM APPLICATIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84894076360     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2013.12.115     Document Type: Letter
Times cited : (23)

References (28)
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    • J.M.P. Alaboson, Q.H. Wang, J.D. Emery, A.L. Lipson, M.J. Bedzyk, J.W. Elam, M.J. Pellin, and M.C. Hersam Seeding atomic layer deposition of high-k dielectrics on epitaxial graphene with organic self-assembled monolayers ACS Nano 5 2011 5223 5232
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    • Graphene growth and device integration
    • L. Colombo, R.M. Wallace, and R.S. Ruoff Graphene growth and device integration Proceed. IEEE 101 2013 1536 1556
    • (2013) Proceed. IEEE , vol.101 , pp. 1536-1556
    • Colombo, L.1    Wallace, R.M.2    Ruoff, R.S.3
  • 26
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    • Effect of composition on the thermal stability of sputter deposited hafnium aluminate and nitrided hafnium aluminate dielectrics on Si (100)
    • P. Sivasubramani, J. Kim, M.J. Kim, B.E. Gnade, and R.M. Wallace Effect of composition on the thermal stability of sputter deposited hafnium aluminate and nitrided hafnium aluminate dielectrics on Si (100) J. Appl. Phys. 101 2007 114108
    • (2007) J. Appl. Phys. , vol.101 , pp. 114108
    • Sivasubramani, P.1    Kim, J.2    Kim, M.J.3    Gnade, B.E.4    Wallace, R.M.5
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.