Wafer-scale graphene integrated circuit

Science

Volumn 332, Issue 6035, 2011, Pages 1294-1297

  Lin, Yu Ming ^a   Valdes Garcia, Alberto ^a   Han, Shu Jen ^a   Farmer, Damon B ^a   Meric, Inanc ^a,b   Sun, Yanning ^a   Wu, Yanqing ^a   Dimitrakopoulos, Christos ^a   Grill, Alfred ^a   Avouris, Phaedon ^a   Jenkins, Keith A ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b Och Spine at New York Presbyterian Hospitals   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHENE; SILICON CARBIDE;

CARBON; EXPERIMENTAL STUDY; PERFORMANCE ASSESSMENT; REDUCTION; SILICON;

ARTICLE; ELECTRIC FIELD; FIELD EFFECT TRANSISTOR; INTEGRATED CIRCUIT; PRIORITY JOURNAL; RADIOFREQUENCY; THERMOSTABILITY;

EID: 79958719398     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1204428     Document Type: Article

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