메뉴 건너뛰기




Volumn 33, Issue 2, 2014, Pages 279-290

Board-level functional fault diagnosis using multikernel support vector machines and incremental learning

Author keywords

Board level fault diagnosis; functional failures; incremental learning; kernel; machine learning; support vector machines

Indexed keywords

BOARD-LEVEL; DIAGNOSIS METHODS; ERROR OBSERVATION; FUNCTIONAL FAILURE; INCREMENTAL LEARNING; KERNEL; LINEAR COMBINATIONS; MACHINE LEARNING TECHNIQUES;

EID: 84893305408     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2013.2287184     Document Type: Article
Times cited : (65)

References (32)
  • 1
    • 39749189436 scopus 로고    scopus 로고
    • Design for board and system level structural test and diagnosis
    • T. Vo, Z. Wang, T. Eaton, P. Ghosh, H. Li, Y. Lee, et al., "Design for board and system level structural test and diagnosis, " in Proc. IEEE ITC, Oct. 2006, pp. 1-10.
    • (2006) Proc. IEEE ITC, Oct. , pp. 1-10
    • Vo, T.1    Wang, Z.2    Eaton, T.3    Ghosh, P.4    Li, H.5    Lee, Y.6
  • 2
    • 39749105320 scopus 로고    scopus 로고
    • Test economics-What can a board/system test engineer do to influence supply operation metrics
    • Oct.
    • S. Tourangeau and B. Eklow, "Test economics-What can a board/system test engineer do to influence supply operation metrics, " in Proc. ITC, Oct. 2006, pp. 1-10.
    • (2006) Proc. ITC , pp. 1-10
    • Tourangeau, S.1    Eklow, B.2
  • 3
    • 39749198552 scopus 로고    scopus 로고
    • A practical approach to comprehensive system test & debug using boundary scan based test architecture
    • Oct.
    • T. Chakraborty, C.-H. Chiang, and B. Van Treuren, "A practical approach to comprehensive system test & debug using boundary scan based test architecture, " in Proc. ITC, Oct. 2007, pp. 1-10.
    • (2007) Proc. ITC , pp. 1-10
    • Chakraborty, T.1    Chiang, C.-H.2    Van Treuren, B.3
  • 4
    • 33847136024 scopus 로고    scopus 로고
    • Remote boundary-scan system test control for the ATCA standard
    • DOI 10.1109/TEST.2005.1584042, 1584042, Reportnr 32.2, IEEE International Test Conference, Proceedings, ITC 2005
    • D. Backstrom, G. Carlsson, and E. Larsson, "Remote boundary-scan system test control for the ATCA standard, " in Proc. ITC, Nov. 2005, pp. 788-797. (Pubitemid 46287573)
    • (2005) Proceedings - International Test Conference , vol.2005 , pp. 788-797
    • Backstrom, D.1    Carlsson, G.2    Larsson, E.3
  • 5
    • 33847162467 scopus 로고    scopus 로고
    • A practical perspective on reducing ASIC NTFs
    • Nov.
    • Z. Conroy, G. Richmond, X. Gu, and B. Eklow, "A practical perspective on reducing ASIC NTFs, " in Proc. ITC, Nov. 2005, pp. 340-349.
    • (2005) Proc. ITC , pp. 340-349
    • Conroy, Z.1    Richmond, G.2    Gu, X.3    Eklow, B.4
  • 6
    • 84864216026 scopus 로고    scopus 로고
    • Reusing and retargeting on-chip instrument access procedures in IEEE P1687
    • Apr.
    • F. G. Zadegan, U. Ingelsson, E. Larsson, and G. Carlsson, "Reusing and retargeting on-chip instrument access procedures in IEEE P1687, " IEEE Design & Test Comput., vol. 29, no. 2, pp. 79-88, Apr. 2012.
    • (2012) IEEE Design & Test Comput. , vol.29 , Issue.2 , pp. 79-88
    • Zadegan, F.G.1    Ingelsson, U.2    Larsson, E.3    Carlsson, G.4
  • 9
    • 33847092422 scopus 로고    scopus 로고
    • The effects of defects on high-speed boards
    • K. Parker, "The effects of defects on high-speed boards, " in Proc. IEEE ITC, Nov. 2005, pp. 178-187.
    • (2005) Proc. IEEE ITC, Nov. , pp. 178-187
    • Parker, K.1
  • 10
    • 18144390639 scopus 로고    scopus 로고
    • At-speed interconnect test and diagnosis of external memories on a system
    • 7.1, Proceedings - International Test Conference 2004
    • H. Kim, H. Jun, X. Gu, and S. Chung, "At-speed interconnect test and diagnosis of external memories on a system, " in Proc. IEEE ITC, Oct. 2004, pp. 156-162. (Pubitemid 40610012)
    • (2004) Proceedings - International Test Conference , pp. 156-162
    • Kim, H.C.1    Jun, H.-S.2    Gu, X.3    Chung, S.S.4
  • 11
    • 80051983391 scopus 로고    scopus 로고
    • Ranking of suspect faulty blocks using dataflow analysis and Dempster-Shafer theory for the diagnosis of board-level functional failures
    • May
    • H. Fang, Z. Wang, X. Gu, and K. Chakrabarty, "Ranking of suspect faulty blocks using dataflow analysis and Dempster-Shafer theory for the diagnosis of board-level functional failures, " in Proc. IEEE ETS, May 2011, pp. 195-200.
    • (2011) Proc. IEEE ETS , pp. 195-200
    • Fang, H.1    Wang, Z.2    Gu, X.3    Chakrabarty, K.4
  • 12
    • 0029237151 scopus 로고
    • Automated fault-tree generation for operational fault diagnosis
    • A. Raaphorst, B. Netten, and R. Vingerhoeds, "Automated fault-tree generation for operational fault diagnosis, " in Proc. IEE Conf. Pub., 1995, pp. 173-177.
    • (1995) Proc. IEE Conf. Pub. , pp. 173-177
    • Raaphorst, A.1    Netten, B.2    Vingerhoeds, R.3
  • 13
    • 0000555770 scopus 로고    scopus 로고
    • Model-based diagnosis using structured system descriptions
    • A. Darwiche, "Model-based diagnosis using structured system descriptions, " J. Artif. Intell. Res., vol. 8, pp. 165-222, Jun. 1998. (Pubitemid 128636197)
    • (1998) Journal of Artificial Intelligence Research , vol.8 , pp. 165-222
    • Darwiche, A.1
  • 14
    • 0033165427 scopus 로고    scopus 로고
    • Model-based diagnosis of hardware designs
    • Jul.
    • G. Friedrich, M. Stumptner, and F. Wotawa, "Model-based diagnosis of hardware designs, "J. Artif. Intell. Res., vol. 111, no. 1, pp. 3-39, Jul. 1999.
    • (1999) J. Artif. Intell. Res. , vol.111 , Issue.1 , pp. 3-39
    • Friedrich, G.1    Stumptner, M.2    Wotawa, F.3
  • 15
    • 77953893973 scopus 로고    scopus 로고
    • Board-level fault diagnosis using Bayesian inference
    • Z. Zhang, Z. Wang, X. Gu, and K. Chakrabarty, "Board-level fault diagnosis using Bayesian inference, " in Proc. IEEE VTS, Apr. 2010, pp. 244-249.
    • (2010) Proc. IEEE VTS, Apr. , pp. 244-249
    • Zhang, Z.1    Wang, Z.2    Gu, X.3    Chakrabarty, K.4
  • 16
    • 84863151354 scopus 로고    scopus 로고
    • Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks
    • Sep.
    • Z. Zhang, K. Chakrabarty, Z. Wang, Z. Wang, and X. Gu, "Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks, " in Proc. IEEE ITC, pp. 1-10, Sep. 2011.
    • Proc. IEEE ITC , vol.2011 , pp. 1-10
    • Zhang, Z.1    Chakrabarty, K.2    Wang, Z.3    Wang, Z.4    Gu, X.5
  • 17
    • 84864720660 scopus 로고    scopus 로고
    • Diagnostic system based on support-vector machines for board-level functional diagnosis
    • May 2012
    • Z. Zhang, X. Gu, and K. Chakrabarty, "Diagnostic system based on support-vector machines for board-level functional diagnosis, " in Proc. IEEE ETS, pp. 1-6, May 2012.
    • Proc. IEEE ETS , pp. 1-6
    • Zhang, Z.1    Gu, X.2    Chakrabarty, K.3
  • 18
    • 33847099544 scopus 로고    scopus 로고
    • Optimized reasoning-based diagnosis for non
    • random, board-level, production defects Nov.
    • C. O'Farrill, M. Moakil-Chbany, and B. Eklow, "Optimized reasoning-based diagnosis for non-random, board-level, production defects, " in Proc. IEEE ITC, Nov. 2005, pp. 173-179.
    • (2005) Proc. IEEE ITC , pp. 173-179
    • O'Farrill, C.1    Moakil-Chbany, M.2    Eklow, B.3
  • 19
    • 0142246844 scopus 로고    scopus 로고
    • Defect coverage of boundary-scan tests: What does it mean when a boundary-scan test passes?
    • K. Parker, "Defect coverage of boundary-scan tests: What does it mean when a boundary-scan test passes?, " in Proc. IEEE ITC, Sep. 2003, pp. 181-189.
    • (2003) Proc. IEEE ITC, Sep. , pp. 181-189
    • Parker, K.1
  • 20
    • 34249753618 scopus 로고
    • Support-vector networks
    • Sep.
    • C. Cortes and V. Vapnik, "Support-vector networks, " J. Mach. Learn., vol. 20, no. 3, pp. 273-297, Sep. 1995.
    • (1995) J. Mach. Learn. , vol.20 , Issue.3 , pp. 273-297
    • Cortes, C.1    Vapnik, V.2
  • 21
    • 71149100224 scopus 로고    scopus 로고
    • More generality in efficient multiple kernel learning
    • M. Varma and B. R. Babu, "More generality in efficient multiple kernel learning, " in Proc. ACM ICML, 2009, pp. 1065-1072.
    • (2009) Proc. ACM ICML , pp. 1065-1072
    • Varma, M.1    Babu, B.R.2
  • 22
    • 8844263749 scopus 로고    scopus 로고
    • A statistical framework for genomic data fusion
    • DOI 10.1093/bioinformatics/bth294
    • G. Lanckriet, T. De Bie, N. Cristianini, M. Jordan, and W. Noble, "A statistical framework for genomic data fusion, " Bioinformatics, vol. 20, no. 16, pp. 2626-2635, May 2004. (Pubitemid 39530149)
    • (2004) Bioinformatics , vol.20 , Issue.16 , pp. 2626-2635
    • Lanckriet, G.R.G.1    De Bie, T.2    Cristianini, N.3    Jordan, M.I.4    Noble, S.5
  • 23
    • 33744913006 scopus 로고    scopus 로고
    • Economic designs for manufacturing system test and field maintenance
    • 1460874, Proceedings of the Thirty-Seventh Southeastern Symposium on System Theory, SST05
    • Y.-T. Lin, "Economic designs for manufacturing system test and field maintenance, " in Proc. IEEE Symp. Syst. Theory, 2005, pp. 40-44. (Pubitemid 43841485)
    • (2005) Proceedings of the Annual Southeastern Symposium on System Theory , vol.37 , pp. 40-44
    • Lin, Y.-T.1
  • 24
    • 0006472145 scopus 로고    scopus 로고
    • Support vector machines for multi-class pattern recognition
    • J. Weston and C. Watkins, "Support vector machines for multi-class pattern recognition, " in Proc. 7th Eur. Symp. Artif. Neur. Netw., vol. 4, 1999, pp. 219-224.
    • (1999) Proc. 7th Eur. Symp. Artif. Neur. Netw. , vol.4 , pp. 219-224
    • Weston, J.1    Watkins, C.2
  • 25
    • 0032594951 scopus 로고    scopus 로고
    • Support vector machines for histogram-based image classification
    • Sep.
    • O. Chapelle, P. Haffner, and V. Vapnik, "Support vector machines for histogram-based image classification, " IEEE Trans. Neur. Netw., vol. 10, no. 5, pp. 1055-1064, Sep. 1999.
    • (1999) IEEE Trans. Neur. Netw. , vol.10 , Issue.5 , pp. 1055-1064
    • Chapelle, O.1    Haffner, P.2    Vapnik, V.3
  • 27
    • 77957549546 scopus 로고    scopus 로고
    • Large scale classification with local diversity AdaBoost SVM algorithm
    • Dec.
    • T. Chang, H. Liu, and S. Zhou, "Large scale classification with local diversity AdaBoost SVM algorithm, " J. Syst. Eng. Electron., vol. 20, no. 6, pp. 1344-1350, Dec. 2009.
    • (2009) J. Syst. Eng. Electron. , vol.20 , Issue.6 , pp. 1344-1350
    • Chang, T.1    Liu, H.2    Zhou, S.3
  • 28
    • 84893326307 scopus 로고    scopus 로고
    • Incremental SVM learning with multiclass support and probabilistic output [online]
    • Incremental SVM learning with multiclass support and probabilistic output [online]. Available: http://www-ti.informatik.uni-tuebingen.de/spueler/ mcpIncSVM/
  • 30
    • 84883403464 scopus 로고    scopus 로고
    • Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis
    • May
    • F Ye, Z. Zhang, K. Chakrabarty, and X. Gu, "Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis, " in Proc. IEEE ETS, May 2013, pp. 94-99.
    • (2013) Proc. IEEE ETS , pp. 94-99
    • Ye, F.1    Zhang, Z.2    Chakrabarty, K.3    Gu, X.4
  • 31
    • 80051919363 scopus 로고    scopus 로고
    • Incremental support vector machine algorithm based on multi-kernel learning
    • Aug.
    • Z. Li, J. Zhang, and S. Hu, "Incremental support vector machine algorithm based on multi-kernel learning, " J. Syst. Eng. Electron., vol. 22, no. 4, pp. 702-706, Aug. 2011.
    • (2011) J. Syst. Eng. Electron. , vol.22 , Issue.4 , pp. 702-706
    • Li, Z.1    Zhang, J.2    Hu, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.