Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks

Proceedings - International Test Conference

Volumn , Issue , 2011, Pages

  Zhang, Zhaobo ^a   Chakrabarty, Krishnendu ^a   Wang, Zhanglei ^b   Wang, Zhiyuan ^b   Gu, Xinli ^b  

^a Duke University   (United States)

^b Huawei Technologies Ltd Co   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOARD-LEVEL; CLOCK FREQUENCY; DIAGNOSIS METHODS; DIAGNOSTIC ACCURACY; DIAGNOSTIC SOFTWARE; FUNCTIONAL FAILURE; LARGE DATASETS; MANUFACTURING COST; NETWORK STRUCTURES; OVER CURRENT; PRODUCT YIELDS; REPAIR COSTS; ROOT CAUSE; ROOT CAUSE OF FAILURES;

NEURAL NETWORKS;

REPAIR;

EID: 84863151354     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2011.6139139     Document Type: Conference Paper

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