A practical approach to comprehensive system test & debug using boundary scan based test architecture

Proceedings - International Test Conference

Volumn , Issue , 2007, Pages

  Chakraborty, Tapan J ^a   Chiang, Chen Huan ^a   Van Treuren, Bradford G ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY; ERROR ANALYSIS; LARGE SCALE SYSTEMS; RELIABILITY ANALYSIS;

BOUNDARY SCAN BASED SYSTEM TEST APPROACH; ELECTRONIC SYSTEMS;

ELECTRONIC EQUIPMENT;

EID: 39749198552     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2007.4437663     Document Type: Conference Paper

References (33)