A practical perspective on reducing ASIC NTFs

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 343-349

  Conroy, Zoe ^a   Richmond, Geoff ^a   Gu, Xinli ^a   Eklow, Bill ^a  

^a CISCO SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CISCO SYSTEMS (CO); HARDWARE DESIGNERS; LOGIC DENSITY; NO TROUBLE FOUND (NTF);

COMPUTER HARDWARE; DATA REDUCTION; INTEGRATED CIRCUIT LAYOUT; LOGIC DESIGN; SYSTEMS ANALYSIS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 33847162467     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1583992     Document Type: Conference Paper

References (0)