Test economics - What can a board/system test engineer do to influence supply operation metrics

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Tourangeau, Sylvain ^a   Eklow, Bill ^a  

^a CISCO SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; DATA REDUCTION; MATHEMATICAL MODELS; PROBLEM SOLVING; SYSTEMS ENGINEERING;

CONTRACT MANUFACTURERS; COST MODELS; HYPOTHETICAL DATA;

OPTICAL TESTING;

EID: 39749105320     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297650     Document Type: Conference Paper

References (8)