The effects of defects on high-speed boards

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 180-187

  Parker, Kenneth P ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLOCK SPEEDS; DATA SIGNALS; EDGE RATES;

CLOCKS; DATA REDUCTION; DEFECTS;

PRINTED CIRCUIT BOARDS;

EID: 33847092422     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1583975     Document Type: Conference Paper

References (4)

1. "Test Coverage: What Does It Mean when a Board Test Passes", K. Hird, K. P. Parker and B. Follis, Proceedings, International Test Conference, pp 1066-1074, Baltimore MD, Oct 2002
2. "High-Speed Digital Design - a Handbook of Black Magic", H. W. Johnson and M. Graham, Prentice Hall PTR, Englewood Cliffs, NJ, 1993
3. "High-Speed Signal Propagation - Advanced Black Magic", H. W. Johnson and M. Graham, Prentice Hall PTR, Englewood Cliffs, NJ, 2003
4. Search the web for "PCI Special Interest Group" or PCI-SIG. To get full details, you must be a member ofPCI-SIG.