Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis

Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013

Volumn , Issue , 2013, Pages

  Ye, Fangming ^a   Zhang, Zhaobo ^b   Chakrabarty, Krishnendu ^a   Gu, Xinli ^b  

^a Duke University   (United States)

^b HUAWEI TECHNOLOGIES CO LTD   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIAGNOSIS SYSTEMS; DISCRIMINATIVE ABILITY; ELECTRONIC PRODUCT; ENHANCEMENT FRAMEWORK; HIGH-VOLUME MANUFACTURING; MACHINE LEARNING TECHNIQUES; ROOT CAUSE ANALYSIS; VOLUME PRODUCTION;

FAILURE ANALYSIS; INFORMATION THEORY; LEARNING SYSTEMS;

DISEASES;

EID: 84883403464     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2013.6569364     Document Type: Conference Paper

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