Design for board and system level structural test and diagnosis

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Vo, Toai ^a   Wang, Zhiyuan ^a   Eaton, Ted ^a   Ghosh, Pradipta ^a   Li, Huai ^a   Lee, Young ^a   Wang, Weili ^a   Jun, Hongshin ^a   Fang, Rong ^a   Singletary, Dan ^a   Gu, Xinli ^a  

^a CISCO SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST BENEFIT ANALYSIS; OPTICAL TESTING; PROBLEM SOLVING; PROGRAM DIAGNOSTICS; TELECOMMUNICATION INDUSTRY;

COST BALANCES; SYSTEM TESTS; TEST ACCESSIBILITY; TEST COMPLETENESS;

SYSTEMS ENGINEERING;

EID: 39749189436     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297631     Document Type: Conference Paper

References (7)