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Volumn 2005, Issue , 2005, Pages 788-797

Remote boundary-scan system test control for the ATCA standard

Author keywords

[No Author keywords available]

Indexed keywords

BUSBARS; DATA STORAGE EQUIPMENT; ELECTRIC WIRING; INTELLIGENT CONTROL; NETWORK PROTOCOLS; STANDARDS; TELECOMMUNICATION LINKS;

EID: 33847136024     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584042     Document Type: Conference Paper
Times cited : (12)

References (18)
  • 1
    • 33847140830 scopus 로고    scopus 로고
    • IEEE Standard 1149.1-2001, IEEE Standard Test Access Port and Boundary-Scan Architecture, IEEE Computer Society.
    • IEEE Standard 1149.1-2001, IEEE Standard Test Access Port and Boundary-Scan Architecture, IEEE Computer Society.
  • 6
    • 33847131251 scopus 로고    scopus 로고
    • 2C-bus, http://www.semiconductors. philips.com/acrobat_download/literature/9398/39340011.pdf
    • 2C-bus, http://www.semiconductors. philips.com/acrobat_download/literature/9398/39340011.pdf
  • 7
    • 33847135073 scopus 로고    scopus 로고
    • Intelligent Platform Management Interface, ftp://download.intel.com/ design/servers/ipmi/ IPMIv2_0vev1_0.pdf
    • Intelligent Platform Management Interface, ftp://download.intel.com/ design/servers/ipmi/ IPMIv2_0vev1_0.pdf
  • 8
    • 77953901108 scopus 로고
    • A Proposed Method of Accessing 1149.1 in a Backplane Environment
    • Baltimore, Maryland, USA, September
    • L. Whetsel, "A Proposed Method of Accessing 1149.1 in a Backplane Environment", Proceedings IEEE International Test Conference (ITC), Baltimore, Maryland, USA, September 1992, pages 206-216.
    • (1992) Proceedings IEEE International Test Conference (ITC) , pp. 206-216
    • Whetsel, L.1
  • 10
    • 0026618691 scopus 로고
    • An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes
    • Nashville, TN, USA, October
    • D. Bhavsar, "An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes", Proceedings of IEEE International Test Conference (ITC), Nashville, TN, USA, October 1991, pages 768-776.
    • (1991) Proceedings of IEEE International Test Conference (ITC) , pp. 768-776
    • Bhavsar, D.1
  • 11
    • 0029510954 scopus 로고
    • A secure data transmission scheme for 1149.1 backplane test bus
    • Washington, DC, USA, October
    • W. Ke, D. Le and N. Jarwala "A secure data transmission scheme for 1149.1 backplane test bus", Proceedings of IEEE International Test Conference (ITC), Washington, DC, USA, October 1995, pages 789-796.
    • (1995) Proceedings of IEEE International Test Conference (ITC) , pp. 789-796
    • Ke, W.1    Le, D.2    Jarwala, N.3
  • 12
    • 33847165186 scopus 로고    scopus 로고
    • IEEE Standard 1149.5-1995, IEEE Standard Module Test and Maintenance (MTM) Bus Protocol, IEEE Computer Society.
    • IEEE Standard 1149.5-1995, IEEE Standard Module Test and Maintenance (MTM) Bus Protocol, IEEE Computer Society.
  • 13
    • 33847117031 scopus 로고    scopus 로고
    • IEEE Standard 1532-2002, IEEE Standard In-System Configuration of Programmable Devices, IEEE Computer Society.
    • IEEE Standard 1532-2002, IEEE Standard In-System Configuration of Programmable Devices", IEEE Computer Society.
  • 18
    • 33847158158 scopus 로고    scopus 로고
    • Data Sheet, Maxim max232, http://pdfserv.maximic.com/en/ds/MAX220-MAX249. pdf
    • Data Sheet, Maxim max232, http://pdfserv.maximic.com/en/ds/MAX220-MAX249. pdf


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.