Design hardening methodologies for ASICs

Radiation Effects on Embedded Systems

Volumn , Issue , 2007, Pages 143-160

  Faccio, Federico ^a  

^a CERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; EMBEDDED SYSTEMS; HARDENING; INTEGRATED CIRCUIT DESIGN; IONIZING RADIATION; RADIATION HARDENING; SPACE APPLICATIONS;

CMOS TECHNOLOGY; HARDENING-BY-DESIGN; SINGLE EVENT EFFECTS; TOTAL IONIZING DOSE;

RADIATION EFFECTS;

EID: 84889791575     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-1-4020-5646-8_7     Document Type: Conference Paper

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