A large dynamic range radiation-tolerant analog memory in a quarter-micron CMOS technology

IEEE Transactions on Nuclear Science

Volumn 48, Issue 3 I, 2001, Pages 435-439

  Anelli, Giovanni ^a,b   Anghinolfi, Francis ^a,b   Rivetti, Angelo ^c  

^a IEEE   (Switzerland)

^b CERN   (Switzerland)

^c UNIVERSITY OF TURIN   (Italy)

Author keywords

Analog memories; Deep submicron CMOS; Radiation hardening; Switched capacitor circuits

Indexed keywords

ANALOG MEMORIES; SWITCHED CAPACITOR CIRCUITS;

CAPACITORS; CMOS INTEGRATED CIRCUITS; HIGH ENERGY PHYSICS; INTEGRATED CIRCUIT LAYOUT; IRRADIATION; SOFTWARE PROTOTYPING; X RAY ANALYSIS;

ANALOG STORAGE;

EID: 0035355462     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.940095     Document Type: Conference Paper

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