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Volumn 84, Issue 10, 2013, Pages

Quantitative thermal microscopy using thermoelectric probe in passive mode

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION PROCEDURE; QUANTITATIVE TECHNIQUES; SCANNING THERMAL MICROSCOPE; SURFACE TEMPERATURE DISTRIBUTION; THERMAL INTERACTION; THERMAL MICROSCOPES; THERMAL MICROSCOPY; THERMOCOUPLE PROBES;

EID: 84887397418     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4824069     Document Type: Article
Times cited : (19)

References (35)
  • 8
    • 79960014774 scopus 로고    scopus 로고
    • 10.1021/nn102818s
    • A. Soudi, R. D. Dawson, and Y. Gu, ACS Nano 5 (1), 255-262 (2011). 10.1021/nn102818s
    • (2011) ACS Nano , vol.5 , Issue.1 , pp. 255-262
    • Soudi, A.1    Dawson, R.D.2    Gu, Y.3
  • 10
    • 84877857000 scopus 로고    scopus 로고
    • 10.1063/1.4803600
    • C. K. Lau and K. S. Sim, AIP Conf. Proc. 1528, 231-236 (2012). 10.1063/1.4803600
    • (2012) AIP Conf. Proc. , vol.1528 , pp. 231-236
    • Lau, C.K.1    Sim, K.S.2
  • 17
    • 0000832716 scopus 로고
    • edited by T. W. Tong (Technomics, Lancaster, PA), Vol.
    • R. B. Dinwiddie, R. J. Pylkki, and P. E. West, Thermal Conductivity, edited by, T. W. Tong, (Technomics, Lancaster, PA, 1994), Vol. 22, p. 668.
    • (1994) Thermal Conductivity , vol.22 , pp. 668
    • Dinwiddie, R.B.1    Pylkki, R.J.2    West, P.E.3
  • 21
  • 30


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.