Scanning thermal imaging by near-field fluorescence spectroscopy

Nanotechnology

Volumn 20, Issue 11, 2009, Pages

  Saïdi, Elika ^a   Samson, Benjamin ^a   Aigouy, Lionel ^a   Volz, Sebastian ^b   Löw, Peter ^c,d   Bergaud, Christian ^c,d   Mortier, Michel ^e  

^a CNRS   (France)

^b ECOLE CENTRALE PARIS   (France)

^c LAAS CNRS   (France)

^d UNIVERSITÉ DE TOULOUSE   (France)

^e UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE SPECTROSCOPY; FLUORINE COMPOUNDS; INFRARED IMAGING; METAL IONS; RARE EARTHS;

ELECTRICAL CURRENT; ELECTRONIC DEVICE; FLUORESCENCE SPECTRA; FLUORESCENT PARTICLE; INTENSITY VARIATIONS; RARE EARTH IONS; SCANNING THERMAL MICROSCOPE; TEMPERATURE PROBES;

FLUORESCENCE;

FLUORIDE; NICKEL;

ARTICLE; ELECTRIC CURRENT; FLUORESCENCE SPECTROSCOPY; INTERMETHOD COMPARISON; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; STIMULATION; TEMPERATURE MEASUREMENT; THERMODYNAMICS;

EID: 65549107453     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/11/115703     Document Type: Article

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