Near-infrared thermography using a charge-coupled device camera: Application to microsystems

Review of Scientific Instruments

Volumn 78, Issue 3, 2007, Pages

  Teyssieux, D ^a   Thiery, L ^a   Cretin, B ^a  

^a FEMTO ST INSTITUTE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CCD CAMERAS; INFRARED RADIATION; MICROSYSTEMS; TEMPERATURE MEASUREMENT;

CCD SENSORS; NEAR INFRARED THERMOGRAPHY MICROSCOPY; PLANCK'S LAW; TEMPERATURE SENSITIVITY;

THERMOGRAPHY (IMAGING);

EID: 34047127426     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2714040     Document Type: Article

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