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Volumn 710, Issue , 2013, Pages 82-86

In situ fine tuning of bendable soft x-ray mirrors using a lateral shearing interferometer

Author keywords

Knife edge measurement; Metrology of x ray optics; Shearing interferometry; Synchrotron radiation

Indexed keywords

INTERFEROMETERS; LIGHT SOURCES; MIRRORS; MULTILAYERS; SUN; SYNCHROTRON RADIATION; UNITS OF MEASUREMENT; X RAY OPTICS;

EID: 84886395591     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2012.10.105     Document Type: Article
Times cited : (11)

References (27)
  • 13
    • 0003877515 scopus 로고    scopus 로고
    • 3rd edition, John Wiley and Sons Inc.
    • D. Malacara, Optical Shop Testing, 3rd edition, John Wiley and Sons Inc., 2007.
    • (2007) Optical Shop Testing
    • Malacara, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.