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Volumn 77, Issue 6, 2006, Pages

At-wavelength figure metrology of hard x-ray focusing mirrors

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; FOCUSING; INTERFEROMETERS; INTERFEROMETRY; OPTICAL SYSTEMS; X RAYS;

EID: 33745685883     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2216870     Document Type: Article
Times cited : (65)

References (25)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.