X ray Wavefront Hartmann Sensor

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 819-822

  Mercère, Pascal ^a,b   Idir, Mourad ^a,b,c,d,e   Zeitoun, Philippe ^a,b,c   Levecq, Xavier ^b   Dovillaire, Guillaume ^b   Bucourt, Samuel ^b   Douillet, Denis ^c   Goldberg, Kenneth A ^d   Naulleau, Patrick P ^d   Rekawa, Senajith ^d  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b Imagine Optic   (France)

^c LABORATOIRE D OPTIQUE APPLIQUÉE   (France)

^d Center for X Ray Optics   (United States)

^e SYNCHROTRON SOLEIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85012278925     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1757921     Document Type: Conference Paper

References (10)

1. P. Mercere, P. Zeitoun, M. Idir, S. Lepape, D. Douillet, X. Levecq, S. Bucourt, G. Dovillaire, K. Goldberg, P. Naulleau, S. Rekawa, Optics letter, vol. 28 n17, Sept. 2003
2. S. Lepape, P. Zeitoun, M. Idir, P. Dhez, J. Rocca, Phys. Rev. Lett. 88, 183901 (2002)
3. I. Ghozeil "Hartmann and other screens tests" in optical Shop Testing, Ed. By D. Malacara, p 367-396, Wiley-International (1992)
4. K. A. Goldberg, Ph. D. dissertation (University of California, Berkeley, 1997).
5. E. Tejnil, K. A. Goldberg, S. H. Lee, H. Medecki, P. J. Batson, P. E. Denham, A. A. MacDowell, and J. Bokor, J. Vac. Sci. Technol. B 15, 2455 (1997).
6. P. P. Naulleau, K. A. Goldberg, S. H. Lee, C. Chang, D. Attwood, and J. Boker, Appl. Opt. 38, 7252 (1999).
7. D. Attwood, P. P. Naulleau, K. A. Goldberg, E. Tejnil, C. Chang, R. Beguiristain, P. Batson, J. Bokor, E. M. Gullikson, M. Koike, H. Medecki, and J. H. Underwood, IEEE Quantum Electron. 35, 709 (1999).
8. K. Medecki, E. Tejnil, K. A. Goldberg, and J. Bokor, Opt. Lett. 21, 1526 (1996).
9. Imagine Optics, patent PCT/FR02/02495 (July 2002).
10. O. Hignette, A. K. Freund and E. Chinchio, Proceedings of SPIE 3152, 188-199 (1997).