Elliptically bent X-ray mirrors with active temperature stabilization

X-Ray Optics and Instrumentation

Volumn 2010, Issue , 2010, Pages

  Yuan, Sheng ^a   Church, Matthew ^a   Yashchuk, Valeriy V ^a   Goldberg, Kenneth A ^a   Celestre, Richard S ^a   McKinney, Wayne R ^a   Kirschman, Jonathan ^b   Morrison, Gregory ^a   Noll, Tino ^c   Warwick, Tony ^a   Padmore, Howard A ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b Ikawamachi Board of Education   (Japan)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77956850911     PISSN: 16877632     EISSN: 16877640     Source Type: Journal    
DOI: 10.1155/2010/784732     Document Type: Article

References (36)

1. Assoufid L., Hignette O., Howells M., Irick S., Lammert H., Takacs P., Future metrology needs for synchrotron radiation grazing-incidence optics Nuclear Instruments and Methods in Physics Research Section A 2001 467-468 267 270
2. Erko A., Idir M., Krist T., Michette A. G., Modern Developments in X-ray and Neutral Optics 2007 Berlin, Germany Springer
3. Kirkpatrick P., Baez A. V., Formation of Optical Images by X-rays Journal of the Optical Society of America 1948 38 9 766 774
4. Liu C., Assoufid L., Conley R., Macrander A. T., Ice G. E., Tischler J. Z., Profile coating and its application for Kirkpatrick-Baez mirrors Optical Engineering 2003 42 12 3622 3628
5. Yumoto H., Mimura H., Matsuyama S., Hara H., Yamamura K., Sano Y., Ueno K., Endo K., Mori Y., Yabashi M., Nishino Y., Tamasaku K., Ishikawa T., Yamauchi K., Fabrication of elliptically figured mirror for focusing hard X Rays to size less than 50nm Review of Scientific Instruments 2005 76 6 5
6. Siewert F., Lammert H., Noll T., Schlegel T., Zeschke T., Hnsel T., Nickel A., Schindler A., Grubert B., Schlewitt C., Advanced metrology, an essential support for the surface finishing of high performance X-ray optics 5921 Advances in Metrology for X-ray and EUV Optics August 2005 San Diego, Calif, USA Proceedings of SPIE
7. Yuan S., Sasian J., Aberrations of anamorphic optical systems. I: the first-order foundation and method for deriving the anamorphic primary aberration coefficients Applied Optics 2009 48 13 2574 2584
8. Yuan S., Sasian J., Aberrations of anamorphic optical systems. II. primary aberration theory for cylindrical anamorphic systems Applied Optics 2009 48 15 2836 2841
9. Howells M. R., Cambie D., Duarte R. M., Irick S., MacDowell A. A., Padmore H. A., Renner T. R., Rah S., Sandler R., Theory and practice of elliptically bent X-ray mirrors Optical Engineering 2000 39 10 2748 2762
10. Takacs P. Z., Bass M., X-ray mirror metrology Handbook of Optics 2009 5 3rd chapter 46 New York, NY, USA McGrawHill
11. Siewert F., Lammert H., Zeschke T., Erko A., Idir M., Krist T., Michette A. G., The nanometer optical component measuring machine Modern Developments in X-ray and Neutron Optic 2008 Berlin, Germany Springer
12. Geckeler R. D., ESAD shearing deflectometry: potentials for synchrotron beamline metrology 6317 Advances in X-ray/EUV Optics, Components, and Applications August 2006 San Diego, Calif, USA Proceedings of SPIE
13. Kimura T., Ohashi H., Mimura H., A stitching figure profiler of large X-ray mirrors using RADSI for sub-aperture data acquisition Nuclear Instruments and Methods in Physics Research Section A 2010 616 2-3 229 232
14. Kirschman J. L., Domning E. E., McKinney W. R., Morrison G. Y., Smith B. V., Yashchuk V. V., Performance of the upgraded LTP-II at the ALS optical metrology laboratory 7077 Advances in X-ray/EUV Optics and Components III August 2008 San Diego, Calif, USA Proceedings of SPIE
15. Yashchuk V. V., Barber S., Domning E. E., Kirschman J. L., Morrison G. Y., Smith B. V., Siewert F., Zeschke T., Geckeler R., Just A., Sub-microradian surface slope metrology with the ALS developmental long trace profiler Nuclear Instruments and Methods in Physics Research Section A 2010 616 2-3 212 223
16. McKinney W. R., Irick S. C., Kirschman J. L., MacDowell A. A., Warwick T., Yashchuk V. V., New procedures for the adjustment of elliptic ally bent mirrors with the long trace profiler 6704 Advances in Metrology for X-ray and EUV Optics II August 2007 San Diego, Calif, USA Proceedings of SPIE
17. McKinney W. R., Irick S. C., Kirschman J. L., MacDowell A. A., Warwick T., Yashchuk V. V., Optimal tuning and calibration of bendabale mirrors with with slope measuring profilers Optical Engineering 2009 48 8
18. Mourikis S., Jark W., Koch E. E., Saile V., Surface temperature and distortion of optical elements exposed to high power synchrotron radiation beams Review of Scientific Instruments 1989 60 7 1474 1478
19. Warwick T., Sharma S., Thermal effects and mirror surface figure requirements for a diagnostic beamline at the advanced light source Nuclear Instruments and Methods in Physics Research A 1992 319 13 185 187
20. Kihara N., Mashima K., Miura S., Miyaji A., Wakamiya K., Takahashi S., Kageyama M., Ichikawa S., Thermal and deformation analyses of side-cooled monochromator mirrors for the SPring-8/Figure-8 soft X-ray undulator Journal of Synchrotron Radiation 1998 5 3 811 813
21. Freund A. K., Challenges for synchrotron X-ray optics 4782 X-ray Mirrors, Crystals, and Multilayers II July 2002 Seattle, Wash, USA Proceedings of SPIE
22. Smither R. K., Lee W., Macrander A., Mills D., Rogers S., Recent experiments with liquid gallium cooling of crystal diffraction opticsa Review of Scientific Instruments 1992 63 2 1746 1754
23. Howells M. R., Some fundamentals of cooled mirrors for synchrotron radiation beam lines Optical Engineering 1996 35 4 1187 1197
24. Beguiristain H. R., Underwood J. H., Koike M., haracterization of thermal distortion effects on beamline optics for EUV interferometry and soft X-ray microscopy Review of Scientific Instruments 1996 67 9 1 9
25. Goldberg K. A., Beguiristain H. R., Bokor J., Medecki H., Jackson K., Attwood D. T. Jr., Sommargren G. E., Spallas J. P., Hostetler R. E., At-wavelength testing of optics for EUV 2437 Electron-Beam, X-ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing V February 1995 Santa Clara, Calif, USA Proceedings of SPIE
26. Qian S., Jark W., Takacs P. Z., Randall K. J., Yun W., In situ surface profiler for high heat load mirror measurement Optical Engineering 1995 34 2 396 402
27. Qian S., Jark W., Sostero G., Gambitta A., Mazzolini F., Savoia A., Precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler Applied Optics 1997 36 16 3769 3775
28. Takacs P. Z., Qian S., Randall K. J., Yun W. B., Li H., Mirror distortion measurements with an In-Situ LTP 3447 Advances in Mirror Technology for Synchrotron X-ray and Laser Applications July 1998 San Diego, Calif, USA Proceedings of SPIE
29. Hignette O., Freund A. K., Chinchio E., Incoherent X-ray mirror surface metrology 3152 Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors July 1997 San Diego, Calif, USA Proceedings of SPIE
30. Revesz P., Kazimirov A., Bazarov I., In situ visualization of thermal distortions of synchrotron radiation optics Nuclear Instruments and Methods in Physics Research Section A 2007 576 2-3 422 429 (Pubitemid 46764404)
31. Kimura T., Handa S., Mimura H., Yumoto H., Yamakawa D., Matsuyama S., Sano Y., Tamasaku K., Nishino Y., Yabashi M., Ishikawa T., Yamauchi K., Development of adaptive mirror for wavefront correction of hard X-ray nanobeam 7077 Advances in X-ray/EUV Optics and Components III August 2008 San Diego, Calif, USA Proceedings of SPIE
32. Kunz M., Tamura N., Chen K., MacDowell A. A., Celestre R. S., Church M. M., Fakra S., Domning E. E., Glossinger J. M., Kirschman J. L., Morrison G. Y., Plate D. W., Smith B. V., Warwick T., Yashchuk V. V., Padmore H. A., Ustundag E., A dedicated superbend X-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source Review of Scientific Instruments 2009 80 3 10
33. Yuan S., Goldberg K., Yashchuk V. V., At-wavelength and optical metrology of bendable X-ray optics for nanofocusing at the ALS Frontiers in Optics 2009, Laser Science XXV, Special Symposium on Optics for Imaging at the Nanoscale and Beyond October 2009 San Jose, Calif, USA
34. Yuan S., Church M., Celestre R., Surface slope metrology and interferometric wave front measurements on deformable soft X-ray mirrors performed in the laboratory and in-situ at-wavelength Proceedings of the 10th International Conference on Synchrotron Radiation Instrumentation October 2009 Melbourne, Australia
35. Yashchuk V. V., Optimal measurement strategies for effective suppression of drift errors Review of Scientific Instruments 2009 80 11 10
36. Yashchuk V. V., Irick S. C., MacDowell A. A., McKinney W. R., Takacs P. Z., Air convection noise of pencil-beam interferometer for long-trace profiler 6317 Advances in X-ray/EUV Optics, Components, and Applications August 2006 San Diego, Calif, USA Proceedings of SPIE