Microscopic measurements of variations in local (photo)electronic properties in nanostructured solar cells

Solar Energy Materials and Solar Cells

Volumn 119, Issue , 2013, Pages 228-234

  Fejfar, Antonín ^a   Hývl, Matěj ^a   Ledinský, Martin ^a   Vetushka, Aliaksei ^a   Stuchlík, Jiří ^a   Kočka, Jan ^a   Misra, Soumyadeep ^b   O'Donnell, Benedict ^b   Foldyna, Martin ^b   Yu, Linwei ^b   Roca I Cabarrocas, Pere ^b  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

Atomic force microscopy; Nanowires; Photoresponse; Random diode arrays; Silicon; Thin films

Indexed keywords

DIODE ARRAYS; LIGHT TRAPPING STRUCTURES; MICROCRYSTALLINE GRAINS; MICROSCOPIC MEASUREMENT; NANOSTRUCTURED SOLAR CELLS; PHOTORESPONSES; PHOTOVOLTAIC CONVERSION; SILICON NANO STRUCTURES;

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; DIODES; ELECTRONIC PROPERTIES; MICROCRYSTALLINE SILICON; NANORODS; NANOWIRES; PHOTODIODES; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SILICON; SOLAR CELLS; THIN FILMS;

AMORPHOUS SILICON;

EID: 84884901963     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2013.07.042     Document Type: Article

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