Everything SAXS: Small-angle scattering pattern collection and correction

Journal of Physics Condensed Matter

Volumn 25, Issue 38, 2013, Pages

  Pauw, Brian Richard ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX NANOSTRUCTURES; DATA COLLECTION; DATA CORRECTIONS; DATA INTERPRETATION; LARGE AMOUNTS; MATHEMATICAL DESCRIPTIONS; NANOSTRUCTURAL; SMALL-ANGLE SCATTERING;

DATA PROCESSING; NANOSTRUCTURES;

SCATTERING;

METHODOLOGY; REVIEW; SMALL ANGLE SCATTERING; STATISTICS; X RAY DIFFRACTION; PROCEDURES;

SCATTERING, SMALL ANGLE; STATISTICS AS TOPIC; X-RAY DIFFRACTION;

EID: 84883565072     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/25/38/383201     Document Type: Review

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