On the absolute calibration of bench-top small-angle X-ray scattering instruments: A comparison of different standard methods

Journal of Applied Crystallography

Volumn 39, Issue 1, 2006, Pages 32-38

  Dreiss, Cécile A ^a,c   Jack, Kevin S ^b   Parker, Andrew P ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b UNIVERSITY OF QUEENSLAND   (Australia)

^c KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645135148     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889805033091     Document Type: Article

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