Small-angle X-ray scattering of extended defects in diamonds

Journal of Applied Crystallography

Volumn 36, Issue 3 I, 2003, Pages 420-424

  Shiryaev, A ^a   Dembo, K ^a   Klyuev, Yu ^b   Naletov, A ^b   Feigelson, B ^c  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b VNIIALMAZ   (Russian Federation)

^c Research Centre Basis   (Russian Federation)

Author keywords

Annealing; Diamond; Extended defects; Small angle X ray scattering

Indexed keywords

DIAMOND;

ANALYTIC METHOD; CLUSTER ANALYSIS; CONFERENCE PAPER; COVALENT BOND; CRYSTALLIZATION; DIFFUSION; RADIATION ABSORPTION; RADIATION SCATTERING; SPECIES DIFFERENTIATION; THERMAL CONDUCTIVITY;

EID: 0038204255     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803000530     Document Type: Conference Paper

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