Ultra-small-angle X-ray scattering at the Advanced Photon Source

Journal of Applied Crystallography

Volumn 42, Issue 3, 2009, Pages 469-479

  Ilavsky, Jan ^a   Jemian, Pete R ^a   Allen, Andrew J ^b   Zhang, Fan ^a   Levine, Lyle E ^b   Long, Gabrielle G ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Advanced Photon Source (APS); Ultra small angle X ray scattering (USAXS)

Indexed keywords

EID: 66249145428     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889809008802     Document Type: Article

References (51)

1. Agamalian, M., Christen, D. K., Drews, A. R., Glinka, C. J., Matsuoka, H. & Wignall, G. D. (1998). J. Appl. Cryst. 31, 235-240.
2. Aizawa, K. & Arai, M. (2006). Phys. B Condens. Matter, 385-386, 1114-1117.
3. Aizawa, K. & Tomimitsu, H. (1995). Phys. B, 213, 884-886.
4. Allen, A. J., Hackley, V. A., Jemian, P. R., Ilavsky, J., Raitano, J. M. & Chan, S.-W. (2008). J. Appl. Cryst. 41, 918-929.
5. Allen, A. J., Jemian, P. R., Black, D. R., Burdette, H. E., Spal, R. D., Krueger, S. & Long, G. G. (1994). Nucl. Instrum. Methods Phys. Res. Sect. A, 347, 487-490.
6. Barker, J. G., Glinka, C. J., Moyer, J. J., Kim, M. H., Drews, A. R. & Agamalian, M. (2005). J. Appl Cryst. 38, 1004-1011.
7. Beaucage, G. (1995). J. Appl. Cryst. 28, 717-728.
8. Bonse, U. & Hart, M. (1965). Appl Phys. Lett. 7, 238-240.
9. Bonse, U. & Hart, M. (1966). Z. Phys. 189, 151-162.
10. Borbely, S., Heiderich, M., Schwahn, D. & Seidl, E. (2000). Phys. B, 276,138-139.
11. Carpenter, J. M., Agamalian, M., Littrell, K. C., Thiyagarajan, P. & Rehm, Ch. (2003). J. Appl. Cryst. 36, 763-768.
12. Cerbino, R., Peverini, L., Potenza, M. A. C., Robert, A., Bosecke, P. & Giglio, M. (2008). Nat. Phys. 4, 238-243.
13. Chu, B., Li, Y. & Gao, T. (1992). Rev. Sci. Instrum. 63, 4128-4133.
14. Chu, B., Yeh, F., Li, Y., Harney, P. J., Rousseau, J., Darovsky, A. & Siddons, D. P. (1994). Rev. Sci. Instrum. 65, 3233-3237.
15. Cotton, J. P. (1991). Editor. Initial Data Treatment: Neutron, X-ray and Light Scattering. Amsterdam: North Holland.
16. Dalesio, L. R., Kraimer, M. R. & Kozubal, A. J. (1993). EPICS Architecture, http://www.aps.anl.gov/epics/docs/general.php.
17. Debye, P. & Bueche, A. M. (1949). J. Appl. Phys. 20, 518-525.
18. Hainbuchner, M., Villa, M., Kroupa, G., Bruckner, G., Baron, M., Amenitsch, H., Seidl, E. & Rauch, H. (2000). J. Appl. Cryst. 33, 851-854.
19. Ilavsky, J., Allen, A. J., Long, G. G. & Jemian, P. R. (2002). Rev. Sci. Instrum. 73, 1660-1662.
20. Ilavsky, J. & Jemian, P. R. (2009). J. Appl. Cryst. 42, 347-353.
21. Ilavsky, J., Jemian, P. R., Allen, A. J. & Long, G. G. (2003). AIP Conference Proceedings Volume 705: Synchrotron Radiation Instrumentation, Eighth International Conference on Synchrotron Radiation Instrumentation, pp. 510-513. Melville: American Institute of Physics.
22. Jemian, P. R. (1990). PhD thesis, Northwestern University, IL, USA.
23. Jemian, P. R. & Long, G. G. (1990). J. Appl. Cryst. 23, 430-432.
24. Jemian, P. R., Weertman, J. R., Long, G. G. & Spal, R. D. (1991). Acta Metall. Mater. 39, 2477-2487.
25. Kammler, H. K., Beaucage, G., Mueller, R. & Pratsinis, S. E. (2004). Langmuir, 20, 1915-1921.
26. Krosigk, G. V., Cunis, S., Gehrke, R. & Kranold, R. (2001). Nucl. Instrum. Methods Phys. Res. Sect. A, 467, 1088-1091.
27. Kulkarni, A., Goland, A., Herman, H., Allen, A. J., Dobbins, T., DeCarlo, F., Ilavsky, J., Long, G. G., Pang, S. & Lawton, P. (2006). Nucl. Instrum. Methods Phys. Res. Sect. A, 426, 43-52.
28. Lai, B., Khounsary, A., Savoy, R., Moog, L. & Gluskin, E. (1993). Undulator A Characteristics and Specifications. Advanced Photon Source, Argonne National Laboratory, IL, USA.
29. Lake, J. A. (1967). Acta Cryst. 23, 191-194.
30. Levine, L. E. & Long, G. G. (2004). J. Appl. Cryst. 37, 757-765.
31. Levine, L. E., Long, G. G., Ilavsky, J., Gerhardt, R. A., Ou, R. & Parker, C. A. (2007). Appl. Phys. Lett. 90, 014101.
32. Lofaj, F., Wiederhorn, S. M., Long, G. G. & Jemian, P. R. (2001). Ceram. Eng. Sci. Proc. 22, 167-174.
33. Long, G. G., Jemian, P. R., Weertman, J. R., Black, D. R., Burdette, H. E. & Spal, R. (1991). J. Appl. Cryst. 24, 30-37.
34. Long, G. G. & Levine, L. E. (2005). Acta Cryst. A61, 557-567.
35. Long, G. G., Levine, L. E. & Fields, R. J. (2001). Mater. Sci. Eng. A Struct. Mater. 309, 28-31.
36. Narayanan, T., Diat, O. & Bosecke, P. (2001). Nucl. Instrum. Methods Phys. Res. Sect. A, 467, 1005-1009.
37. Parratt, L. G. (1954). Phys. Rev. 95, 359-369.
38. Potton, J. A., Daniell, G. J. & Rainford, B. D. (1988). J. Appl. Cryst. 21, 663-668.
39. Renteria, A. F., Saruhan, B., Ilavsky, J. & Allen, A. J. (2007). Surf. Coat. Technol. 201, 4781-4788.
40. Rieker, T. P. & Hubbard, P. F. (1998). Rev. Sci. Instrum. 69, 3504-3509.
41. Schaefer, D. W., Brown, J. M., Anderson, D. P., Zhao, J., Chokalingam, K., Tomlin, D. & Ilavsky, J. (2003). J. Appl. Cryst. 36, 553-557.
42. Schelten, J. & Schmatz, W. (1980). J. Appl. Cryst. 13, 385-390.
43. Schwahn, D. & Koo, M. H. (1986). Studies of Heterogeneities of Micrometer-Range with Double Crystal Diffractometer, Atomic Transport and Defects in Metals by Neutron Scattering, edited by W. P. C. Janot, D. Richter & T. Springer, pp. 83-88. Berlin: Springer-Verlag.
44. Schwahn, D., Miksovsky, A., Rauch, H., Seidl, E. & Zugarek, G. (1985). Nucl. Instrum. Methods Phys. Res. Sect. A, 239, 229-234.
45. Shinohara, Y., Kishimoto, H., Inoue, K., Suzuki, Y., Takeuchi, A., Uesugi, K., Yagi, N., Muraoka, K., Mizoguchi, T. & Amemiya, Y. (2007). J. Appl. Cryst. 40, s397-s401.
46. Shu, D., Toellner, T. S. & Alp, E. E. (2001). Nucl. Instrum. Methods Phys. Res. Sect. A, 467-468, 771-774.
47. Smolsky, I. L., Liu, P., Niebuhr, M., Ito, K., Weiss, T. M. & Tsuruta, H. (2007). J. Appl. Cryst. 40, s453-s458.
48. Swislow, G. (2009). Spec. Certified Scientific Software, Cambridge, Massachusetts, USA, http://www.certif.com/spec.html.
49. Sztucki, M., Gorini, J., Vassalli, J.-P., Goirand, L., van Vaerenbergh, P. & Narayanan, T. (2008). J. Synchrotron Rad. 15, 341-349.
50. Zhang, F., Long, G. G., Jemian, P. R., Ilavsky, J., Milam, V. T. & Lewis, J. A. (2008). Langmuir, 24, 6504-6508.
51. Zhang, F., Long, G. G., Levine, L. E., Ilavsky, J. & Jemian, P. R. (2008). J. Appl. Cryst. 41, 416-427.