High-energy ultra-small-angle X-ray scattering instrument at the Advanced Photon Source

Journal of Applied Crystallography

Volumn 45, Issue 6, 2012, Pages 1318-1320

  Ilavsky, Jan ^a   Allen, Andrew J ^b   Levine, Lyle E ^b   Zhang, Fan ^b   Jemian, Pete R ^c   Long, Gabrielle G ^a,b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Bonse Hart instruments; ultra high small angle X ray scattering (SAXS) resolution; ultra small angle X ray scattering (USAXS)

Indexed keywords

ADVANCED PHOTON SOURCE; BONSE-HART; CRYSTAL OPTICS; CRYSTAL REFLECTIVITY; HIGH ENERGY; OPERATIONAL STABILITY; SCATTERING INTENSITY; SIZE RANGES; SMALL ANGLE X-RAY SCATTERING; X-RAY ENERGIES;

CRYSTALLOGRAPHY; ELEMENTARY PARTICLE SOURCES; INSTRUMENTS; PHYSICAL OPTICS; SCATTERING; SILICON; X RAY SCATTERING;

X RAYS;

EID: 84869183106     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812040022     Document Type: Article

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