Scatter: Software for the analysis of nano-and mesoscale small-angle scattering

Journal of Applied Crystallography

Volumn 43, Issue 3, 2010, Pages 639-646

  Forster S ^a   Apostol, L ^b   Bras, W ^b  

^a UNIVERSITY OF HAMBURG   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77952509132     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810008289     Document Type: Article

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